학술논문

Design and Simulation of a Highly Sensitive Charge Detector With Nondestructive Readout Mode for Fully Depleted Thick CCDs
Document Type
Periodical
Source
IEEE Transactions on Electron Devices IEEE Trans. Electron Devices Electron Devices, IEEE Transactions on. 70(2):563-569 Feb, 2023
Subject
Components, Circuits, Devices and Systems
Engineered Materials, Dielectrics and Plasmas
Logic gates
Charge coupled devices
Substrates
Voltage
Implants
Electric potential
Transistors
Charge-coupled device (CCD)
DEPFET
NDR
single electron sensitive readout (SiSeRO)
single-electron
single-photon
Skipper-CCD
sub-electron noise
Language
ISSN
0018-9383
1557-9646
Abstract
Several applications with charge-coupled devices (CCDs) and Skipper-CCDs can be significantly improved with an enhancement in pixel readout speed. In this work, we present the design and TCAD modeling of a highly sensitive double-gate MOSFET for charge amplification in CCD detectors. The design steps followed to integrate the device into high-voltage fully-depleted thick CCDs are described. Like Skipper-CCDs, the device allows for nondestructive readout of the charge packet for noise reduction. The simulations predict a sensitivity of $2.5\,\,\text {nA}/\text {e}^{-}$ and a readout noise of $2.4\,\,\text {e}^{-}_{\text {rms}}/\text {pix}$ at a readout speed of $300 \text {kpixels/s}$ . In a multisampling operation, a readout noise of $0.1\,\,\text {e}^{-}_{\text {rms}}/\text {pix}$ can also be achieved at a readout speed in the order of $700 \text {pixels/s}$ , approximately seven times faster than the Skipper-CCD at that same readout noise level.