학술논문
Imprint of ferroelectric PLZT thin-film capacitors with lanthanum strontium cobalt oxide electrodes
Document Type
Conference
Author
Source
Proceedings of 1994 IEEE International Symposium on Applications of Ferroelectrics Ferroelectrics applications Applications of Ferroelectrics, 1994.ISAF '94., Proceedings of the Ninth IEEE International Symposium on. :66-69 1994
Subject
Language
Abstract
The ferroelectric imprint is measured on thin-film PLZT capacitors with lanthanum strontium cobalt oxide top and bottom electrodes. The data show a significant amount of imprint with a combined elevated temperature and alternating (unipolar) voltage stress. No imprint was observed on samples that were temperature stressed without external bias.