학술논문

Mechanical Properties and Strain-Induced Filament Degradation of Ex Situ and In Situ MgB2 Wires
Document Type
Periodical
Source
IEEE Transactions on Applied Superconductivity IEEE Trans. Appl. Supercond. Applied Superconductivity, IEEE Transactions on. 26(3):1-5 Apr, 2016
Subject
Fields, Waves and Electromagnetics
Engineered Materials, Dielectrics and Plasmas
Wires
Strain
Integrated circuits
Niobium
Degradation
Lattices
Stress
Superconductor
MgB2
XRD
lattice distortion
stress
strain
Language
ISSN
1051-8223
1558-2515
2378-7074
Abstract
We have compared the mechanical properties and the degradation of the critical current after uniaxial tensile loading at room temperature (RT) and at 77 K of ex situ and in situ MgB 2 wires. The strain that the wires can withstand without degradation is at 77 K substantially higher than at RT. In order to explain the mechanical behavior of the wires, the lattice distortions of the different wire constituents and their texture have been measured simultaneously with the composite wire stress and strain in a high-energy synchrotron beamline. The different MgB 2 microstructure in both wire types is revealed in filament cross sections prepared by the focused-ion-beam technique and in fracture surfaces.