학술논문
Non-destructive MEMS atomic vapor cells characterization by Raman spectroscopy and image analysis
Document Type
Conference
Source
2016 European Frequency and Time Forum (EFTF) European Frequency and Time Forum (EFTF), 2016. :1-3 Apr, 2016
Subject
Language
Abstract
The use of innovative and non-destructive methods to characterize the content of MEMS atomic vapor cells for atomic devices is reported: Raman spectroscopy is used as a fast and quantitative method to estimate the Nitrogen pressure inside the cell cavity and image analysis is used to quantify the amount of metallic Rubidium. These techniques can be used for buffer gas pressure optimization and cell lifetime assessment.