학술논문

Metal-Embedded Chip Assembly Processing for Enhanced RF Circuit Performance
Document Type
Periodical
Source
IEEE Transactions on Microwave Theory and Techniques IEEE Trans. Microwave Theory Techn. Microwave Theory and Techniques, IEEE Transactions on. 67(9):3537-3546 Sep, 2019
Subject
Fields, Waves and Electromagnetics
Integrated circuit interconnections
Gallium nitride
Wires
Silicon
Radio frequency
Microwave circuits
Copper
Couplers
GaN
heterogeneous integration
interconnects
multi-chip modules
power amplifiers (PAs)
transmission lines
Language
ISSN
0018-9480
1557-9670
Abstract
This paper presents the radio frequency (RF) benefits of a heterogeneous integration technique for multi-chip modules. Passive components, such as lumped metal–insulator–semiconductor (MIS) and ceramic capacitors, as well as coupler circuits implemented on alumina substrates, are integrated in a metal-embedded chip assembly (MECA) process together with GaN monolithic microwave-integrated circuits (MMICs) in a way that provides a common RF and thermal ground. Simulations show that photolithographically defined interconnects can outperform wire bonds from 10 to 100 GHz. The interconnect layer of the MECA process forms bridge transmission lines with lower loss and comparable dispersion to microstrip lines, and with 35% higher characteristic impedances, validated by measurements up to 25 GHz. Microstrip Lange and branch-line couplers are designed partially on alumina and completed with MECA interconnects during the integration process, resulting in good performance in agreement with simulations. Finally, measurements of a GaN power amplifier (PA) MMIC integrated into the MECA process show gain and power-added efficiency (PAE) improvements of up to 3 dB and 3.2 percentage points, respectively.