부산대학교 도서관

The ability to understand and predict the effects on electronic systems that might result from an intentional EMI attack is crucial to defending critical electronic systems against such a threat. To address this need we are building a predictive model for effects on digital electronics, based on combining electromagnetic coupling models with an investigation of the response of electronics at the device, circuit and system level. As a critical part of this work we have focused our research on understanding and predicting the response of a microcontroller to a high-power electromagnetic waveform. Our approach is to expose the microcontroller to electromagnetic pulses with carefully controlled onset times and durations, while making use of software implemented in assembly language to exercise various functional areas and hence various physical regions of the microcontroller, with the aim of developing fundamental insight into the upset mechanism. In this paper we address how the effect of an electromagnetic pulse on a specific microcontroller varies with pulse duration. In particular we explore how the system responds to two pulses injected at various times while the microcontroller is executing a specified instruction, and investigate the question of when these pulses may be considered as independent events. We present the results from our experiments, as well as summarizing some of our recent work aimed at building a general predictive model.