학술논문
Characteristic length scales of the electrically induced insulator-to-metal transition
Document Type
article
Author
Theodor Luibrand; Adrien Bercher; Rodolfo Rocco; Farnaz Tahouni-Bonab; Lucia Varbaro; Carl Willem Rischau; Claribel Domínguez; Yixi Zhou; Weiwei Luo; Soumen Bag; Lorenzo Fratino; Reinhold Kleiner; Stefano Gariglio; Dieter Koelle; Jean-Marc Triscone; Marcelo J. Rozenberg; Alexey B. Kuzmenko; Stefan Guénon; Javier del Valle
Source
Physical Review Research, Vol 5, Iss 1, p 013108 (2023)
Subject
Language
English
ISSN
2643-1564
Abstract
Some correlated materials display an insulator-to-metal transition as the temperature is increased. In most cases, this transition can also be induced electrically, resulting in volatile resistive switching due to the formation of a conducting filament. While this phenomenon has attracted much attention due to potential applications, many fundamental questions remain unaddressed. One of them is its characteristic lengths: What sets the size of these filaments, and how does this impact resistive switching properties? Here, we use a combination of wide-field and scattering-type scanning near-field optical microscopies to characterize filament formation in NdNiO_{3} and SmNiO_{3} thin films. We find a clear trend: Smaller filaments increase the current density, yielding sharper switching and a larger resistive drop. With the aid of numerical simulations, we discuss the parameters controlling the filament width and, hence, the switching properties.