학술논문
The X-ray Polarization Probe mission concept
Document Type
Working Paper
Author
Jahoda, Keith; Krawczynski, Henric; Kislat, Fabian; Marshall, Herman; Okajima, Takashi; Agudo, Ivan; Angelini, Lorella; Bachetti, Matteo; Baldini, Luca; Baring, Matthew; Baumgartner, Wayne; Bellazzini, Ronaldo; Bianchi, Stefano; Bucciantini, Niccolo; Caiazzo, Ilaria; Capitanio, Fiamma; Coppi, Paolo; Costa, Enrico; De Rosa, Alessandra; Del Monte, Ettore; Dexter, Jason; Di Gesu, Laura; Di Lalla, Niccolo; Doroshenko, Victor; Dovciak, Michal; Ferrazzoli, Riccardo; Fuerst, Felix; Garner, Alan; Ghosh, Pranab; Gonzalez-Caniulef, Denis; Grinberg, Victoria; Gunji, Shuichi; Hartman, Dieter; Hayashida, Kiyoshi; Heyl, Jeremy; Hill, Joanne; Ingram, Adam; Iwakiri, Wataru Buz; Jorstad, Svetlana; Kaaret, Phil; Kallman, Timothy; Karas, Vladimir; Khabibullin, Ildar; Kitaguchi, Takao; Kolodziejczak, Jeff; Kouveliotou, Chryssa; Liodakis, Yannis; Maccarone, Thomas; Manfreda, Alberto; Marin, Frederic; Marinucci, Andrea; Markwardt, Craig; Marscher, Alan; Matt, Giorgio; McConnell, Mark; Miller, Jon; Mitsubishi, Ikuyuki; Mizuno, Tsunefumi; Mushtukov, Alexander; Ng, Stephen; Nowak, Michael; O'Dell, Steve; Papitto, Alessandro; Pasham, Dheeraj; Pearce, Mark; Peirson, Lawrence; Perri, Matteo; Rollins, Melissa Pesce; Petrosian, Vahe; Petrucci, Pierre-Olivier; Pilia, Maura; Possenti, Andrea; Poutanen, Juri; Prescod-Weinstein, Chanda; Puccetti, Simonetta; Salmi, Tuomo; Shi, Kevin; Soffita, Paolo; Spandre, Gloria; Steiner, Jack; Strohmayer, Tod; Suleimanov, Valery; Svoboda, Jiri; Swank, Jean; Tamagawa, Toru; Takahashi, Hiromitsu; Taverna, Roberto; Tomsick, John; Trois, Alessio; Tsygankov, Sergey; Turolla, Roberto; Vink, Jacco; Wilms, Joern; Wu, Kinwah; Xie, Fei; Younes, George; Zaino, Alessandra; Zajczyk, Anna; Zane, Silvia; Zdziarski, Andrzej; Zhang, Haocheng; Zhang, Wenda; Zhou, Ping
Source
Subject
Language
Abstract
The X-ray Polarization Probe (XPP) is a second generation X-ray polarimeter following up on the Imaging X-ray Polarimetry Explorer (IXPE). The XPP will offer true broadband polarimetery over the wide 0.2-60 keV bandpass in addition to imaging polarimetry from 2-8 keV. The extended energy bandpass and improvements in sensitivity will enable the simultaneous measurement of the polarization of several emission components. These measurements will give qualitatively new information about how compact objects work, and will probe fundamental physics, i.e. strong-field quantum electrodynamics and strong gravity.
Comment: submitted to Astrophysics Decadal Survey as a State of the Profession white paper
Comment: submitted to Astrophysics Decadal Survey as a State of the Profession white paper