학술논문 – 법학도서관

학술논문

replay검색결과 돌아가기

search검색화면

Origin of the Critical Thickness in Improper Ferroelectric Thin Films.

Document Type

Article

Author

Vogel, Alexander; Ruiz Caridad, Alicia; Nordlander, Johanna; Sarott, Martin F.; Meier, Quintin N.; Erni, Rolf; Spaldin, Nicola A.; Trassin, Morgan; Rossell, Marta D.

Source

ACS Applied Materials & Interfaces; 4/12/2023, Vol. 15 Issue 14, p18482-18492, 11p

Subject

Language

ISSN

19448244

Online Access

Full Text (ACS) Web of Science JCR 저널정보 Scopus Find it@PNU

이메일