학술논문

High-Throughput Growth of Wafer-Scale Monolayer Transition Metal Dichalcogenide via Vertical Ostwald Ripening.
Document Type
Academic Journal
Author
Seol M; Samsung Advanced Institute of Technology, Suwon, 443-803, Republic of Korea.; Lee MH; Samsung Advanced Institute of Technology, Suwon, 443-803, Republic of Korea.; Kim H; Samsung Advanced Institute of Technology, Suwon, 443-803, Republic of Korea.; Shin KW; Samsung Advanced Institute of Technology, Suwon, 443-803, Republic of Korea.; Cho Y; Samsung Advanced Institute of Technology, Suwon, 443-803, Republic of Korea.; Jeon I; Samsung Advanced Institute of Technology, Suwon, 443-803, Republic of Korea.; Jeong M; Samsung Advanced Institute of Technology, Suwon, 443-803, Republic of Korea.; Lee HI; Samsung Advanced Institute of Technology, Suwon, 443-803, Republic of Korea.; Park J; Department of Chemistry, University of Chicago, Chicago, IL, 60637, USA.; Shin HJ; Samsung Advanced Institute of Technology, Suwon, 443-803, Republic of Korea.
Source
Publisher: Wiley-VCH Country of Publication: Germany NLM ID: 9885358 Publication Model: Print-Electronic Cited Medium: Internet ISSN: 1521-4095 (Electronic) Linking ISSN: 09359648 NLM ISO Abbreviation: Adv Mater Subsets: PubMed not MEDLINE; MEDLINE
Subject
Language
English
Abstract
For practical device applications, monolayer transition metal dichalcogenide (TMD) films must meet key industry needs for batch processing, including the high-throughput, large-scale production of high-quality, spatially uniform materials, and reliable integration into devices. Here, high-throughput growth, completed in 12 min, of 6-inch wafer-scale monolayer MoS 2 and WS 2 is reported, which is directly compatible with scalable batch processing and device integration. Specifically, a pulsed metal-organic chemical vapor deposition process is developed, where periodic interruption of the precursor supply drives vertical Ostwald ripening, which prevents secondary nucleation despite high precursor concentrations. The as-grown TMD films show excellent spatial homogeneity and well-stitched grain boundaries, enabling facile transfer to various target substrates without degradation. Using these films, batch fabrication of high-performance field-effect transistor (FET) arrays in wafer-scale is demonstrated, and the FETs show remarkable uniformity. The high-throughput production and wafer-scale automatable transfer will facilitate the integration of TMDs into Si-complementary metal-oxide-semiconductor platforms.
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