학술논문

Dose rate assessment of spot-scanning very high energy electrons radiotherapy driven by laser plasma acceleration.
Document Type
Article
Source
Journal of Applied Physics. 5/21/2023, Vol. 133 Issue 19, p1-9. 9p.
Subject
*LASER plasma accelerators
*MONTE Carlo method
*WATER distribution
*ELECTRONS
*PHOTON beams
*PARTICLE beam bunching
*RADIOTHERAPY
Language
ISSN
0021-8979
Abstract
Laser plasma accelerators (LPA) can produce very high-energy electrons (VHEE) with ultra-short bunch duration, which may facilitate the application of ultra-high dose rate radiotherapy (FLASH-RT) to treat deep-seated tumors. The study aims to evaluate the dose rate delivery by spot-scanning VHEE beams produced by LPA and to discuss the feasibility and beam specifications for FLASH-RT implementation. Various dose rate metrics, including averaged dose rate (ADR), dose-averaged dose rate (DADR), and dose-threshold dose rate (DTDR), are examined in the context of spot-scanning. Theoretical analysis and Monte Carlo simulations are employed to quantify the dose rate distribution for a water phantom and explore the impact of beam parameters. All the beam parameters are based on experimental results. With a lower pulse repetition rate of 5 Hz, ADR can only reach a dose rate in the order of 10 − 1 Gy / s , while attaining the FLASH-RT dose rate of 40 Gy / s necessitates the utilization of high-power lasers with a kilohertz working repetition rate. In contrast to ADR, DADR and DTDR remain independent of the scanning path and can reach the ultra-high dose rate surpassing 10 14 Gy / s at the phantom surface. Meanwhile, the ultrashort electron bunch can be stretched during scattering within the water, resulting in a dependence of DADR and DTDR on the penetration depth. Both the charge per shot and angular spread are important parameters in dose rate calculations. This investigation offers insights into practical beam parameters for preclinical applications and supplies guidance for designing the LPAs suitable for future spot-scanning VHEE FLASH-RT. [ABSTRACT FROM AUTHOR]