학술논문
Ion-beam analysis for cultural heritage on the AGLAE facility: impact of PIXE/RBS combination.
Document Type
Article
Author
Source
Subject
*X-ray spectroscopy
*BACKSCATTERING
*SCATTERING (Physics)
*PROTONS
*CULTURAL property
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*
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Language
ISSN
0947-8396
Abstract
The combination of particle-induced X-ray emission (PIXE) and Rutherford backscattering (RBS) is particularly fruitful for the study of cultural heritage objects. Several set-ups have been developed at the AGLAE facility of the Louvre Laboratory to implement these techniques with an external beam. Successively have been tested the simultaneous use of PIXE and RBS with a single beam of protons, the sequential application of PIXE with protons and RBS with 4He2+ ions and finally the simultaneous implementation of PIXE and RBS with high-energy 4He2+ ions. Several examples illustrate the benefits of these combinations of techniques. [ABSTRACT FROM AUTHOR]