학술논문
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Basnet, S.; Huber, G. M.; Li, W. B.; Blok, H. P.; Gaskell, D.; Horn, T.; Aniol, K.; Arrington, J.; Beise, E. J.; Boeglin, W.; Brash, E. J.; Breuer, H.; Chang, C. C.; Christy, M. E.; Ent, R.; Gibson, E.; Holt, R. J.; Jin, S.; Jones, M. K.; Keppel, C. E.; Kim, W.; King, P. M.; Kovaltchouk, V.; Liu, J.; Lolos, G. J.; Mack, D. J.; Margaziotis, D. J.; Markowitz, P.; Matsumura, A.; Meekins, D.; Miyoshi, T.; Mkrtchyan, H.; Niculescu, I.; Okayasu, Y.; Pentchev, L.; Perdrisat, C.; Potterveld, D.; Punjabi, V.; Reimer, P.; Reinhold, J.; Roche, J.; Sarty, A.; Smith, G. R.; Tadevosyan, V.; Tang, L. G.; Tvaskis, V.; Volmer, J.; Vulcan, W.; Warren, G.; Wood, S. A.; Xu, C.; Zheng, X.
Academic Journal
Basnet, S; Huber, GM; Li, WB; Blok, HP; Gaskell, D; Horn, T; Aniol, K; Arrington, J; Beise, EJ; Boeglin, W; Brash, EJ; Breuer, H; Chang, CC; Christy, ME; Ent, R; Gibson, E; Holt, RJ; Jin, S; Jones, MK; Keppel, CE; Kim, W; King, PM; Kovaltchouk, V; Liu, J; Lolos, GJ; MacK, DJ; Margaziotis, DJ; Markowitz, P; Matsumura, A; Meekins, D; Miyoshi, T; Mkrtchyan, H; Niculescu, I; Okayasu, Y; Pentchev, L; Perdrisat, C; Potterveld, D; Punjabi, V; Reimer, P; Reinhold, J; Roche, J; Sarty, A; Smith, GR; Tadevosyan, V; Tang, LG; Tvaskis, V; Volmer, J; Vulcan, W; Warren, G; Wood, SA; Xu, C; Zheng, X
Physical Review C. 100(6)
Academic Journal
Basnet, S; Huber, GM; Li, WB; Blok, HP; Gaskell, D; Horn, T; Aniol, K; Arrington, J; Beise, EJ; Boeglin, W; Brash, EJ; Breuer, H; Chang, CC; Christy, ME; Ent, R; Gibson, E; Holt, RJ; Jin, S; Jones, MK; Keppel, CE; Kim, W; King, PM; Kovaltchouk, V; Liu, J; Lolos, GJ; Mack, DJ; Margaziotis, DJ; Markowitz, P; Matsumura, A; Meekins, D; Miyoshi, T; Mkrtchyan, H; Niculescu, I; Okayasu, Y; Pentchev, L; Perdrisat, C; Potterveld, D; Punjabi, V; Reimer, P; Reinhold, J; Roche, J; Sarty, A; Smith, GR; Tadevosyan, V; Tang, LG; Tvaskis, V; Volmer, J; Vulcan, W; Warren, G; Wood, SA; Xu, C; Zheng, X
Physical Review C. 100(6)
Conference
Amrouch, H.; Anders, J.; Becker, S.; Betka, M.; Bleher, G.; Domanski, P.; Elhamawy, N.; Ertl, T.; Gatzastras, A.; Genssler, P.; Hasler, S.; Heinrich, M.; van Hoorn, A.; Jafarzadeh, H.; Kallfass, I.; Klemme, F.; Koch, S.; Kusters, R.; Lalama, A.; Latty, R.; Liao, Y.; Lylina, N.; Haghi, Z. Najafi; Pfluger, D.; Polian, I.; Rivoir, J.; Sauer, M.; Schwachhofer, D.; Templin, S.; Volmer, C.; Wagner, S.; Weiskopf, D.; Wunderlich, H.-J.; Yang, B.; Zimmermann, M.
2022 Design, Automation & Test in Europe Conference & Exhibition (DATE) Design, Automation & Test in Europe Conference & Exhibition (DATE), 2022. :969-974 Mar, 2022
Conference
2013 International Conference on Simulation of Semiconductor Processes and Devices (SISPAD) Simulation of Semiconductor Processes and Devices (SISPAD), 2013 International Conference on. :45-48 Sep, 2013
Conference
Oproiu, Mihai; Neagu, Andrei; Cotfas, Petru A.; Cotfas, Daniel T.; Musuroi, Cristian; Volmer, Marius
2021 International Aegean Conference on Electrical Machines and Power Electronics (ACEMP) & 2021 International Conference on Optimization of Electrical and Electronic Equipment (OPTIM) Electrical Machines and Power Electronics (ACEMP) & 2021 International Conference on Optimization of Electrical and Electronic Equipment (OPTIM), 2021 International Aegean Conference on. :505-512 Sep, 2021
Report
Icking, E.; Banszerus, L.; Wörtche, F.; Volmer, F.; Schmidt, P.; Steiner, C.; Engels, S.; Hesselmann, J.; Goldsche, M.; Watanabe, K.; Taniguchi, T.; Volk, C.; Beschoten, B.; Stampfer, C.
Adv. Electron. Mater. 8, 2200510 (2022)
Report
Phys. Rev. Appl. 18, 014028 (2022)
Report
Bisswanger, T.; Winter, Z.; Schmidt, A.; Volmer, F.; Watanabe, K.; Taniguchi, T.; Stampfer, C.; Beschoten, B.
Nano Lett. 22, 4949 (2022)
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