학술논문
'학술논문'
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Academic Journal
Shimura, D.; Sekikawa, R.; Kotani, K.; Uekawa, M.; Maeno, Y.; Aoyama, K.; Sasaki, H.; Takamori, T.; Masuko, K.; Nakaya, S.
IEEE Photonics Technology Letters IEEE Photon. Technol. Lett. Photonics Technology Letters, IEEE. 18(16):1738-1740 Aug, 2006
Uekawa K; Feil Family Brain and Mind Research Institute, Weill Cornell Medicine, New York, NY, 10021, USA.; Hattori Y; Feil Family Brain and Mind Research Institute, Weill Cornell Medicine, New York, NY, 10021, USA.; Ahn SJ; Feil Family Brain and Mind Research Institute, Weill Cornell Medicine, New York, NY, 10021, USA.; Seo J; Feil Family Brain and Mind Research Institute, Weill Cornell Medicine, New York, NY, 10021, USA.; Casey N; Feil Family Brain and Mind Research Institute, Weill Cornell Medicine, New York, NY, 10021, USA.; Anfray A; Feil Family Brain and Mind Research Institute, Weill Cornell Medicine, New York, NY, 10021, USA.; Zhou P; Feil Family Brain and Mind Research Institute, Weill Cornell Medicine, New York, NY, 10021, USA.; Luo W; Feil Family Brain and Mind Research Institute, Weill Cornell Medicine, New York, NY, 10021, USA.; Anrather J; Feil Family Brain and Mind Research Institute, Weill Cornell Medicine, New York, NY, 10021, USA.; Park L; Feil Family Brain and Mind Research Institute, Weill Cornell Medicine, New York, NY, 10021, USA. lap2003@med.cornell.edu.; Iadecola C; Feil Family Brain and Mind Research Institute, Weill Cornell Medicine, New York, NY, 10021, USA. coi2001@med.cornell.edu.
Publisher: BioMed Central Country of Publication: England NLM ID: 101266600 Publication Model: Electronic Cited Medium: Internet ISSN: 1750-1326 (Electronic) Linking ISSN: 17501326 NLM ISO Abbreviation: Mol Neurodegener Subsets: PubMed not MEDLINE; MEDLINE
Academic Journal
Uekawa K; Feil Family Brain and Mind Research Institute, Weill Cornell Medicine, New York, New York, USA.; Anfray A; Feil Family Brain and Mind Research Institute, Weill Cornell Medicine, New York, New York, USA.; Ahn SJ; Feil Family Brain and Mind Research Institute, Weill Cornell Medicine, New York, New York, USA.; Casey N; Feil Family Brain and Mind Research Institute, Weill Cornell Medicine, New York, New York, USA.; Seo J; Feil Family Brain and Mind Research Institute, Weill Cornell Medicine, New York, New York, USA.; Zhou P; Feil Family Brain and Mind Research Institute, Weill Cornell Medicine, New York, New York, USA.; Iadecola C; Feil Family Brain and Mind Research Institute, Weill Cornell Medicine, New York, New York, USA.; Park L; Feil Family Brain and Mind Research Institute, Weill Cornell Medicine, New York, New York, USA.
Publisher: John Wiley & Sons, Ltd Country of Publication: United States NLM ID: 101231978 Publication Model: Print-Electronic Cited Medium: Internet ISSN: 1552-5279 (Electronic) Linking ISSN: 15525260 NLM ISO Abbreviation: Alzheimers Dement Subsets: MEDLINE
Academic Journal
IEEE Transactions on Consumer Electronics IEEE Trans. Consumer Electron. Consumer Electronics, IEEE Transactions on. 36(3):567-571 Aug, 1990
Academic Journal
IEEE Photonics Technology Letters IEEE Photon. Technol. Lett. Photonics Technology Letters, IEEE. 15(7):945-947 Jul, 2003
Academic Journal
Journal of the Ceramic Society of Japan, Supplement. 2004, :37
Academic Journal
Preprints of Annual Meeting of The Ceramic Society of Japan Preprints of Fall Meeting of The Ceramic Society of Japan. 2003, :24
Conference
Digest of Papers Microprocesses and Nanotechnology 2003. 2003 International Microprocesses and Nanotechnology Conference Microprocesses and nanotechnology Microprocesses and Nanotechnology Conference, 2003. Digest of Papers. 2003 International. :178-179 2003
Conference
Sasaki, H.; Uekawa, M.; Maeno, Y.; Kotani, K.; Shimura, D.; Sekikawa, R.; Takamori, T.; Ori, T.; Masuko, K.; Katsuki, Y.
2006 Optical Fiber Communication Conference and the National Fiber Optic Engineers Conference Optical Fiber Communication Optical Fiber Communication Conference, 2006 and the 2006 National Fiber Optic Engineers Conference. OFC 2006. :3 pp. 2006
Conference
Masuko, K.; Ori, T.; Tanaka, T.; Inoue, M.; Sasaki, H.; Uekawa, M.; Maeno, Y.; Kotani, K.; Shimura, D.; Sekikawa, R.; Takamori, T.
56th Electronic Components and Technology Conference 2006 Electronic Components & Technology Electronic Components and Technology Conference, 2006. Proceedings. 56th. :5 pp. 2006
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[검색어] Uekawa, K
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