학술논문
'학술논문'
에서 검색결과 56건 | 목록
1~10
Conference
Morillon, Dann; Julien, Franck; Coignus, Jean; Toffoli, Alain; Welter, Loic; Jahan, Carine; Reynard, Jean-Philippe; Richard, Emmanuel; Masson, Pascal
2017 International Conference of Microelectronic Test Structures (ICMTS) Microelectronic Test Structures (ICMTS), 2017 International Conference of. :1-5 Mar, 2017
Conference
Dobri, Adam; Morillon, Dann; Jeannot, Simon; Piazza, Fausto; Jahan, Carine; Toffoli, Alain; Perniola, Luca; Balestra, Francis
2017 Joint International EUROSOI Workshop and International Conference on Ultimate Integration on Silicon (EUROSOI-ULIS) Ultimate Integration on Silicon (EUROSOI-ULIS), 2017 Joint International EUROSOI Workshop and International Conference on. :117-119 Apr, 2017
Conference
Barci, Marinela; Molas, Gabriel; Toffoli, Alain; Bernard, Mathieu; Roule, Anne; Cagli, Carlo; Cluzel, Jacques; Vianello, Elisa; De Salvo, Barbara; Perniola, Luca
2015 IEEE International Memory Workshop (IMW) Memory Workshop (IMW), 2015 IEEE International. :1-4 May, 2015
Conference
Charbonnier, Jean; Assous, Myriam; Bally, Jean-Philippe; Cuchet, Robert; Mourier, Thierry; Minoret, Stephane; Magis, Thomas; Toffoli, Alain; Allain, Fabienne; Simon, Gilles
2013 Eurpoean Microelectronics Packaging Conference (EMPC) Microelectronics Packaging Conference (EMPC) , 2013 European. :1-6 Sep, 2013
Conference
Sunohara, Masahiro; Miyairi, Ken; Mori, Kenichi; Murayama, Kei; Charbonnier, Jean; Assous, Myriam; Bally, JeanPhilippe; Mourier, Thierry; Minoret, Stephane; Mercier, Denis; Toffoli, Alain; Allain, Fabienne; Martinez, Eugenie; Feldis, Helene; Simon, Gilles; Higashi, Mitsutoshi
2013 IEEE 63rd Electronic Components and Technology Conference Electronic Components and Technology Conference (ECTC), 2013 IEEE 63rd. :334-341 May, 2013
Conference
Jaud, Marie-Anne; Scheiblin, Pascal; Martinie, Sebastien; Casse, Mikael; Rozeau, Olivier; Dura, Julien; Mazurier, Jerome; Toffoli, Alain; Thomas, Olivier; Andrieu, Francois; Weber, Olivier
2010 International Conference on Simulation of Semiconductor Processes and Devices Simulation of Semiconductor Processes and Devices (SISPAD), 2010 International Conference on. :283-286 Sep, 2010
Conference
Kumar, Pushpendra; Leroux, Charles; Mohamad, Blend; Toffoli, Alain; Romano, Giovanni; Garros, Xavier; Reimbold, Gilles; Domengie, Florian; Segovia, Carlos Suarez; Ghibaudo, G.
2017 IEEE International Reliability Physics Symposium (IRPS) Reliability Physics Symposium (IRPS),2017 IEEE International. :2B-2.1-2B-2.7 Apr, 2017
Conference
Leduc, Patrick; Di Cioccio, Lea; Charlet, Barbara; Rousseau, Maxime; Assous, Myriam; Bouchu, David; Roule, Anne; Zussy, Marc; Gueguen, Pierric; Roman, Antonio; Rozeau, Olivier; Heitzmann, Michel; Nieto, Jean-Pierre; Vandroux, Laurent; Haumesser, Paul-Henri; Quenouillere, Remi; Toffoli, Alain; Sixt, Pierre; Maitrejean, Sylvain; Clavelier, Laurent; Sillon, Nicolas
2008 International Symposium on VLSI Technology, Systems and Applications (VLSI-TSA) VLSI Technology, Systems and Applications, 2008. VLSI-TSA 2008. International Symposium on. :76-78 Apr, 2008
Conference
Toffoli, Alain; Maitrejean, Sylvain; de Pontcharra, Jean Duport; de Crecy, Francois; Bouchu, David; Arnaud, Lucile; Boulanger, Fabien
2008 IEEE International Conference on Microelectronic Test Structures Microelectronic Test Structures, 2008. ICMTS 2008. IEEE International Conference on. :210-213 Mar, 2008
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[검색어] Toffoli, Alain
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