학술논문

발행년
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(예 : 2010-2015)
'학술논문' 에서 검색결과 18건 | 목록 1~10
Conference
2010 IEEE International 3D Systems Integration Conference (3DIC) 3D Systems Integration Conference (3DIC), 2010 IEEE International. :1-6 Nov, 2010
Conference
Proceedings of the 9th International Symposium on the Physical and Failure Analysis of Integrated Circuits (Cat. No.02TH8614) Physical and failure analysis of integrated circuits Physical and Failure Analysis of Integrated Circuits, 2002. IPFA 2002. Proceedings of the 9th International Symposium on the. :111-117 2002
Conference
2010 IEEE International Interconnect Technology Conference Interconnect Technology Conference (IITC), 2010 International. :1-3 Jun, 2010
Academic Journal
Parikh P; Department of NanoEngineering, University of California San Diego, 9500 Gilman Drive, La Jolla, CA 92093, USA.; Senowitz C; Qualcomm Technologies, Inc., 5775 Morehouse Drive, San Diego, CA 92121, USA.; Lyons D; Qualcomm Technologies, Inc., 5775 Morehouse Drive, San Diego, CA 92121, USA.; Martin I; CAMECA Instruments, Inc., 5500 Nobel Drive, Madison, WI 53711, USA.; Prosa TJ; CAMECA Instruments, Inc., 5500 Nobel Drive, Madison, WI 53711, USA.; DiBattista M; Varioscale, Inc., 1782 La Costa Meadows Dr #103, San Marcos, CA 92078, USA.; Devaraj A; Physical and Computational Sciences Directorate, Pacific Northwest National Laboratory, P.O. Box 999, Richland, WA 99352, USA.; Meng YS; Department of NanoEngineering, University of California San Diego, 9500 Gilman Drive, La Jolla, CA 92093, USA.
Publisher: Oxford University Press Country of Publication: United States NLM ID: 9712707 Publication Model: Print-Electronic Cited Medium: Internet ISSN: 1435-8115 (Electronic) Linking ISSN: 14319276 NLM ISO Abbreviation: Microsc Microanal Subsets: PubMed not MEDLINE
Conference
Proceedings of the 9th International Symposium on the Physical & Failure Analysis of Integrated Circuits (Cat. No.02TH8614); 2002, p111-117, 7p
Conference
In: Conference Proceedings from the International Symposium for Testing and Failure Analysis, ISTFA 2016 - Conference Proceedings from the 42nd International Symposium for Testing and Failure Analysis. (Conference Proceedings from the International Symposium for Testing and Failure Analysis, 2016, :574-579)
Conference
In: Conference Proceedings from the International Symposium for Testing and Failure Analysis, ISTFA 2014 - Conference Proceedings from the 40th International Symposium for Testing and Failure Analysis. (Conference Proceedings from the International Symposium for Testing and Failure Analysis, 2014, 2014-January(January):474-479)
Conference
In: Conference Proceedings from the International Symposium for Testing and Failure Analysis, ISTFA 2014 - Conference Proceedings from the 40th International Symposium for Testing and Failure Analysis. (Conference Proceedings from the International Symposium for Testing and Failure Analysis, 2014, 2014-January(January):278-283)
Conference
In: Proceedings of SPIE - The International Society for Optical Engineering, Metrology, Inspection, and Process Control for Microlithography XXVII. (Proceedings of SPIE - The International Society for Optical Engineering, 2013, 8681)
Conference
In: Conference Proceedings from the International Symposium for Testing and Failure Analysis, ISTFA 2010 - Conference Proceedings from the 36th International Symposium for Testing and Failure Analysis. (Conference Proceedings from the International Symposium for Testing and Failure Analysis, 2010, :186-190)
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[검색어] Senowitz, C.
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