부산대학교 도서관

Nibhanupudi SST; Microelectronics Research Center, Department of Electrical and Computer Engineering, The University of Texas at Austin, Austin, Texas 78758, United States.; Roy A; Microelectronics Research Center, Department of Electrical and Computer Engineering, The University of Texas at Austin, Austin, Texas 78758, United States.; Department of Physics, Birla Institute of Technology Mesra, Ranchi, Jharkhand 835215, India.; Chowdhury S; Microelectronics Research Center, Department of Electrical and Computer Engineering, The University of Texas at Austin, Austin, Texas 78758, United States.; Schalip R; Microelectronics Research Center, Department of Electrical and Computer Engineering, The University of Texas at Austin, Austin, Texas 78758, United States.; Coupin MJ; Texas Materials Institute, The University of Texas at Austin, Austin, Texas 78712, United States.; Matthews KC; Texas Materials Institute, The University of Texas at Austin, Austin, Texas 78712, United States.; Alam MH; Microelectronics Research Center, Department of Electrical and Computer Engineering, The University of Texas at Austin, Austin, Texas 78758, United States.; Satpati B; Surface Physics and Material Science Division, Saha Institute of Nuclear Physics, 1/AF, Bidhannagar, Kolkata 700 064, India.; Movva HCP; Microelectronics Research Center, Department of Electrical and Computer Engineering, The University of Texas at Austin, Austin, Texas 78758, United States.; Luth CJ; Microelectronics Research Center, Department of Electrical and Computer Engineering, The University of Texas at Austin, Austin, Texas 78758, United States.; Wu S; Microelectronics Research Center, Department of Electrical and Computer Engineering, The University of Texas at Austin, Austin, Texas 78758, United States.; Warner JH; Texas Materials Institute, The University of Texas at Austin, Austin, Texas 78712, United States.; Banerjee SK; Microelectronics Research Center, Department of Electrical and Computer Engineering, The University of Texas at Austin, Austin, Texas 78758, United States.

Publisher: American Chemical Society Country of Publication: United States NLM ID: 101504991 Publication Model: Print-Electronic Cited Medium: Internet ISSN: 1944-8252 (Electronic) Linking ISSN: 19448244 NLM ISO Abbreviation: ACS Appl Mater Interfaces Subsets: PubMed not MEDLINE; MEDLINE

Roy, A.; Dey, R.; Pramanik, T.; Rai, A.; Schalip, R.; Majumder, S.; Banerjee, S.K.; Guchhait, S.

In: Physical Review Materials. (Physical Review Materials, 10 February 2020, 4(2))

Myron Rausch

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