부산대학교 도서관

Yunusa, M; Schulz, AK; Parker, T; Schneider, F; Elibol, K; Predel, M; Dzíbelová, J; Rebmann, M; Gorkan, T; Ye, J; Tan, J; Kang, W; van Aken, PA; Meixner, AJ; Durgun, E; Kotakoski, J; Zhang, D; Sitti, M

Advanced Materials.

Propst, D.; Kotakoski, J.; Åhlgren, E. H.

Bui TA; University of Vienna, Faculty of Physics, Vienna, Austria.; Lamprecht D; University of Vienna, Faculty of Physics, Vienna, Austria.; Institute for Microelectronics, TU Wien, Vienna, Austria.; Madsen J; University of Vienna, Faculty of Physics, Vienna, Austria.; Kurpas M; Institute of Physics, University of Silesia in Katowice, Chorzów, Poland.; Kotrusz P; Danubia NanoTech s.r.o., Bratislava, Slovakia.; Institute of Electrical Engineering of SAS, Bratislava, Slovakia.; Markevich A; University of Vienna, Faculty of Physics, Vienna, Austria.; Mangler C; University of Vienna, Faculty of Physics, Vienna, Austria.; Kotakoski J; University of Vienna, Faculty of Physics, Vienna, Austria.; Filipovic L; Institute for Microelectronics, TU Wien, Vienna, Austria.; Meyer JC; Eberhard Karls University of Tuebingen, Institute of Applied Physics, Tuebingen, Germany.; NMI Natural and Medical Sciences Institute at the University of Tübingen, Markwiesenstr. 55, Reutlingen, Germany.; Pennycook TJ; University of Antwerp, EMAT, Antwerp, Belgium.; Skákalová V; University of Vienna, Faculty of Physics, Vienna, Austria.; Danubia NanoTech s.r.o., Bratislava, Slovakia.; University of Antwerp, EMAT, Antwerp, Belgium.; University of West Bohemia in Pilsen New Technologies - Research Centre Univerzitní 8, Pilsen, Czech Republic.; Mustonen K; University of Vienna, Faculty of Physics, Vienna, Austria.

Publisher: American Association for the Advancement of Science Country of Publication: United States NLM ID: 0404511 Publication Model: Print-Electronic Cited Medium: Internet ISSN: 1095-9203 (Electronic) Linking ISSN: 00368075 NLM ISO Abbreviation: Science Subsets: MEDLINE; PubMed not MEDLINE

Speckmann C.; Angeletti A.; Kyvala L.; Lamprecht D.; Herterich F.; Mangler C.; Filipovic L.; Dellago C.; Franchini C.; Kotakoski J.

Advanced Materials Interfaces, Vol 12, Iss 9, Pp n/a-n/a (2025)

Emmrich, D.; Beyer, A.; Nadzeyka, A.; Bauerdick, S.; Meyer, J. C.; Kotakoski, J.; Gölzhäuser, A.

APPLIED PHYSICS LETTERS 108, 163103 (2016)

Susi, T.; Meyer, J. C.; Kotakoski, J.

Ultramicroscopy 2017

Argentero, G.; Mittelberger, A.; Monazam, M. R. A.; Cao, Y.; Pennycook, T. J.; Mangler, C.; Kramberger, C.; Kotakoski, J.; Geim, A. K.; Meyer, J. C.

Lamprecht D; Institute for Microelectronics, TU Vienna, Gusshausstrasse 27-29, Vienna, 1040, Austria; University of Vienna, Faculty of Physics, Boltzmanngasse 5, Vienna, 1090, Austria. Electronic address: lamprecht@iue.tuwien.ac.at.; Chokappa S; University of Vienna, Faculty of Physics, Boltzmanngasse 5, Vienna, 1090, Austria.; Freilinger AM; University Paris-Saclay, CNRS, Laboratoire de Physique des Solides, 510 Rue André Rivière, Paris, 91405, France.; Mayer BM; University of Vienna, Faculty of Physics, Boltzmanngasse 5, Vienna, 1090, Austria.; Melchior M; University of Vienna, Faculty of Physics, Boltzmanngasse 5, Vienna, 1090, Austria.; Dzíbelová J; University of Vienna, Faculty of Physics, Boltzmanngasse 5, Vienna, 1090, Austria.; Lorber D; University of Vienna, Faculty of Physics, Boltzmanngasse 5, Vienna, 1090, Austria.; Tizei LHG; University Paris-Saclay, CNRS, Laboratoire de Physique des Solides, 510 Rue André Rivière, Paris, 91405, France.; Kociak M; University Paris-Saclay, CNRS, Laboratoire de Physique des Solides, 510 Rue André Rivière, Paris, 91405, France.; Mangler C; University of Vienna, Faculty of Physics, Boltzmanngasse 5, Vienna, 1090, Austria.; Filipovic L; Institute for Microelectronics, TU Vienna, Gusshausstrasse 27-29, Vienna, 1040, Austria.; Kotakoski J; University of Vienna, Faculty of Physics, Boltzmanngasse 5, Vienna, 1090, Austria.

Publisher: Elsevier Country of Publication: Netherlands NLM ID: 7513702 Publication Model: Print-Electronic Cited Medium: Internet ISSN: 1879-2723 (Electronic) Linking ISSN: 03043991 NLM ISO Abbreviation: Ultramicroscopy Subsets: MEDLINE; PubMed not MEDLINE

Gupta T; Institute of Materials Chemistry, Technische Universität Wien (TU Wien), Getreidemarkt 9/165, A-1060 Vienna, Austria.; Elibol K; University of Vienna, Faculty of Physics, Boltzmanngasse 5, A-1090 Vienna, Austria.; Max Planck Institute for Solid State Research, Heisenbergstrasse 1, 70569 Stuttgart, Germany.; Stöger-Pollach M; USTEM, Technische Universität Wien (TU Wien), Wiedner Hauptstrasse 8-10, A-1040 Vienna, Austria.; Mustonen K; University of Vienna, Faculty of Physics, Boltzmanngasse 5, A-1090 Vienna, Austria.; Mangler C; University of Vienna, Faculty of Physics, Boltzmanngasse 5, A-1090 Vienna, Austria.; Meyer JC; University of Vienna, Faculty of Physics, Boltzmanngasse 5, A-1090 Vienna, Austria.; Institute of Applied Physics, Eberhard Karls University of Tuebingen, Auf der Morgenstelle 10, D-72076 Tuebingen, Germany.; Kotakoski J; University of Vienna, Faculty of Physics, Boltzmanngasse 5, A-1090 Vienna, Austria.; Bayer BC; Institute of Materials Chemistry, Technische Universität Wien (TU Wien), Getreidemarkt 9/165, A-1060 Vienna, Austria.; University of Vienna, Faculty of Physics, Boltzmanngasse 5, A-1090 Vienna, Austria.; Eder D; Institute of Materials Chemistry, Technische Universität Wien (TU Wien), Getreidemarkt 9/165, A-1060 Vienna, Austria.

Publisher: American Chemical Society Country of Publication: United States NLM ID: 101504991 Publication Model: Print-Electronic Cited Medium: Internet ISSN: 1944-8252 (Electronic) Linking ISSN: 19448244 NLM ISO Abbreviation: ACS Appl Mater Interfaces Subsets: MEDLINE

Liebsch Y; Faculty of Physics and CENIDE, University of Duisburg-Essen, Duisburg 47057, Germany.; Leino A; Department of Physics and Helsinki Institute of Physics, University of Helsinki, Helsinki 000014, Finland.; Madauß L; Faculty of Physics and CENIDE, University of Duisburg-Essen, Duisburg 47057, Germany.; Singh R; Faculty of Physics, University of Vienna, Vienna 1090, Austria.; Grande PL; Instituto de Física, Universidade Federal do Rio Grande do Sul, Porto Alegre 91500, Brazil.; Tomić Luketić K; Ruder Bošković Institute, Zagreb 10000, Croatia.; Karlušić M; Ruder Bošković Institute, Zagreb 10000, Croatia.; Maas A; Faculty of Physics and CENIDE, University of Duisburg-Essen, Duisburg 47057, Germany.; Breuer L; Faculty of Physics and CENIDE, University of Duisburg-Essen, Duisburg 47057, Germany.; Lebius H; CIMAP-GANIL, CEA-CNRS-ENSICAEN-UCN, Caen 14076, France.; Grygiel C; CIMAP-GANIL, CEA-CNRS-ENSICAEN-UCN, Caen 14076, France.; Toimil-Molares ME; Material Research, GSI Helmholtz Centre for Heavy Ion Research GmbH, Darmstadt 64291, Germany.; Trautmann C; Material Research, GSI Helmholtz Centre for Heavy Ion Research GmbH, Darmstadt 64291, Germany.; Johnson ATC; Department of Physics and Astronomy, University of Pennsylvania, Philadelphia, Pennsylvania 19104, United States.; Zhao M; Department of Physics and Astronomy, University of Pennsylvania, Philadelphia, Pennsylvania 19104, United States.; Muinos HV; Department of Physics and Helsinki Institute of Physics, University of Helsinki, Helsinki 000014, Finland.; Tripathi M; Faculty of Physics, University of Vienna, Vienna 1090, Austria.; Akhmadaliev S; Institute of Ion Beam Physics and Materials Research, Helmholtz-Zentrum Dresden-Rossendorf, Dresden 01328, Germany.; Kotakoski J; Faculty of Physics, University of Vienna, Vienna 1090, Austria.; Djurabekova F; Department of Physics and Helsinki Institute of Physics, University of Helsinki, Helsinki 000014, Finland.; Schleberger M; Faculty of Physics and CENIDE, University of Duisburg-Essen, Duisburg 47057, Germany.

Publisher: American Chemical Society Country of Publication: United States NLM ID: 101504991 Publication Model: Print-Electronic Cited Medium: Internet ISSN: 1944-8252 (Electronic) Linking ISSN: 19448244 NLM ISO Abbreviation: ACS Appl Mater Interfaces Subsets: MEDLINE; PubMed not MEDLINE

Argentero, G.; Mangler, C.; Kotakoski, J.; Eder, F. R.; Meyer, J. C.

Ultramicroscopy 151, 23-30 (2015)

Meyer, J. C.; Eder, F.; Kurasch, S.; Skakalova, V.; Kotakoski, J.; Park, H. -J.; Roth, S.; Chuvilin, A.; Eyhusen, S.; Benner, G.; Krasheninnikov, A. V.; Kaiser, U.

Phys. Rev. Lett. 108, 196102 (2012)

Kotakoski, J.; Meyer, J. C.; Kurasch, S.; Santos-Cottin, D.; Kaiser, U.; Krasheninnikov, A. V.

Phys. Rev. B 83, 245420 (2011)

Lehtinen, O.; Kotakoski, J.; Krasheninnikov, A. V.; Keinonen, J.

Nanotechnology 22, 175306 (2011)

Susi Toma; Dellby Niklas; Hayner Russ; Hofer Christoph; Kotakoski Jani; Lovejoy Tracy Clark; Mangler Clemens; Mittelberger Andreas; Pennycook Timothy J.; Plotkin-Swing Benjamin

BIO Web of Conferences, Vol 129, p 04003 (2024)

Kotakoski, J.; Krasheninnikov, A. V.; Kaiser, U.; Meyer, J. C.

Phys. Rev. Lett., 106, 105505 (2011)

Åhlgren, E. H.; Hämäläinen, S. K.; Lehtinen, O.; Liljeroth, P.; Kotakoski, J.

Phys. Rev. B 88, 155419 (2013)

Åhlgren, E. H.; Kotakoski, J.; Lehtinen, O.; Krasheninnikov, A. V.

Appl. Phys. Lett., 100, 233108 (2012)

Åhlgren, E. H.; Kotakoski, J.; Krasheninnikov, A. V.

Phys. Rev. B 83, 115424 (2011)

Aggarwal V; Centre for Optoelectronic Materials and Sensors (COMAS), School of Engineering, RMIT University, 124 La Trobe Street, Melbourne, Victoria 3001, Australia.; CSIR-National Physical Laboratory, Dr. K.S. Krishnan Marg, New Delhi 110012, India.; Academy of Scientific & Innovative Research (AcSIR), Ghaziabad 201002, India.; Abidi IH; Centre for Optoelectronic Materials and Sensors (COMAS), School of Engineering, RMIT University, 124 La Trobe Street, Melbourne, Victoria 3001, Australia.; Limb J; School of Chemistry, Monash University, Clayton, Victoria 3800, Australia.; Kofler C; Faculty of Physics, University Vienna, Boltzmanngasse 5, Vienna 1090, Austria.; Verma AK; Centre for Optoelectronic Materials and Sensors (COMAS), School of Engineering, RMIT University, 124 La Trobe Street, Melbourne, Victoria 3001, Australia.; CSIR-National Physical Laboratory, Dr. K.S. Krishnan Marg, New Delhi 110012, India.; Academy of Scientific & Innovative Research (AcSIR), Ghaziabad 201002, India.; Giridhar SP; Centre for Optoelectronic Materials and Sensors (COMAS), School of Engineering, RMIT University, 124 La Trobe Street, Melbourne, Victoria 3001, Australia.; Dissanayake NSL; School of Engineering, ANU College of Systems & Society, The Australian National University, Canberra, ACT 2601, Australia.; Vashishtha P; Centre for Optoelectronic Materials and Sensors (COMAS), School of Engineering, RMIT University, 124 La Trobe Street, Melbourne, Victoria 3001, Australia.; CSIR-National Physical Laboratory, Dr. K.S. Krishnan Marg, New Delhi 110012, India.; Academy of Scientific & Innovative Research (AcSIR), Ghaziabad 201002, India.; Tollerud JO; Optical Sciences Centre, Swinburne University of Technology, Hawthorn, Victoria 3122, Australia.; Mao J; Centre for Optoelectronic Materials and Sensors (COMAS), School of Engineering, RMIT University, 124 La Trobe Street, Melbourne, Victoria 3001, Australia.; Sehrawat M; Centre for Optoelectronic Materials and Sensors (COMAS), School of Engineering, RMIT University, 124 La Trobe Street, Melbourne, Victoria 3001, Australia.; Gupta T; Centre for Optoelectronic Materials and Sensors (COMAS), School of Engineering, RMIT University, 124 La Trobe Street, Melbourne, Victoria 3001, Australia.; Kannan B; Centre for Optoelectronic Materials and Sensors (COMAS), School of Engineering, RMIT University, 124 La Trobe Street, Melbourne, Victoria 3001, Australia.; Panahandeh-Fard M; Centre for Optoelectronic Materials and Sensors (COMAS), School of Engineering, RMIT University, 124 La Trobe Street, Melbourne, Victoria 3001, Australia.; Ahmed T; Centre for Optoelectronic Materials and Sensors (COMAS), School of Engineering, RMIT University, 124 La Trobe Street, Melbourne, Victoria 3001, Australia.; Lu Y; School of Engineering, ANU College of Systems & Society, The Australian National University, Canberra, ACT 2601, Australia.; Davis JA; School of Engineering, ANU College of Systems & Society, The Australian National University, Canberra, ACT 2601, Australia.; Russo SP; School of Science, RMIT University, 124 La Trobe Street, Melbourne, Victoria 3000, Australia.; Kotakoski J; Faculty of Physics, University Vienna, Boltzmanngasse 5, Vienna 1090, Austria.; Della Gaspera E; School of Science, RMIT University, 124 La Trobe Street, Melbourne, Victoria 3000, Australia.; Bentley CL; School of Chemistry, Monash University, Clayton, Victoria 3800, Australia.; Kushvaha SS; CSIR-National Physical Laboratory, Dr. K.S. Krishnan Marg, New Delhi 110012, India.; Academy of Scientific & Innovative Research (AcSIR), Ghaziabad 201002, India.; Walia S; Centre for Optoelectronic Materials and Sensors (COMAS), School of Engineering, RMIT University, 124 La Trobe Street, Melbourne, Victoria 3001, Australia.

Publisher: American Chemical Society Country of Publication: United States NLM ID: 101504991 Publication Model: Print-Electronic Cited Medium: Internet ISSN: 1944-8252 (Electronic) Linking ISSN: 19448244 NLM ISO Abbreviation: ACS Appl Mater Interfaces Subsets: MEDLINE; PubMed not MEDLINE