학술논문
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KRAS: Methods and Protocols. 04/04/2024. 2797:67-90
Conference
Hung, S.; Mochizuki, S.; Pal, A.; He, X.; Zhao, C.; Bazizi, E. M.; Zhou, H.; Li, J.; Tariq, A.; Gasasira, A.; Chen, V.; Chen, H.; Londono-Calderon, A.; Peethala, B.; Anekal, P.; Loubet, N.; Colombeau, B.; Haran, B.
2025 Symposium on VLSI Technology and Circuits (VLSI Technology and Circuits) VLSI Technology and Circuits (VLSI Technology and Circuits), 2025 Symposium on. :1-3 Jun, 2025
Academic Journal
Annals of Economics and Statistics, 2024 Dec 01(156), 67-114.
Academic Journal
IEEE Electron Device Letters IEEE Electron Device Lett. Electron Device Letters, IEEE. 46(5):741-744 May, 2025
Academic Journal
Sarkar, E.; Zhang, C.; Chakraborty, D.; Gopal Kirtania, S.; Akif Aabrar, K.; Park, H.; Shin, J.; Jae Lee, H.; Tian, M.; Khan, A.I.; Yu, S.; Datta, S.
IEEE Transactions on Electron Devices IEEE Trans. Electron Devices Electron Devices, IEEE Transactions on. 72(5):2662-2669 May, 2025
Conference
2025 Devices for Integrated Circuit (DevIC) Integrated Circuit (DevIC), 2025 Devices for. :474-478 Apr, 2025
Conference
Zhou, H.; Hasanuzzaman, M.; Suk, S. D.; Emans, S.; Siddiqui, S.; Robison, R.; Vega, R.; Wang, M.; Sulehria, Y.; Mochizuki, S.; Durfee, C.; Gluschenkov, O.; Fokas, N.; Bajpai, G.; Leobandung, E.; Mo, R.; Krishnan, R.; Okada, K.; Miki, H.; Qin, L.; Child, C.; Standaert, T.; Zhao, K.; Sohn, D.; Fukuzaki, Y.; Tomida, K.; Guo, D.; Bu, H.
2025 IEEE International Reliability Physics Symposium (IRPS) Reliability Physics Symposium (IRPS), 2025 IEEE International. :1-8 Mar, 2025
Academic Journal
전기전자재료학회논문지 / Journal of the Korean Institute of Electrical and Electronic Material Engineers. Jul 01, 2025 38(4):396
Conference
2025 Conference of Science and Technology of Integrated Circuits (CSTIC) Science and Technology of Integrated Circuits (CSTIC), 2025 Conference of. :1-3 Mar, 2025
Conference
2024 IEEE Microwaves, Antennas, and Propagation Conference (MAPCON) Microwaves, Antennas, and Propagation Conference (MAPCON), 2024 IEEE. :1-4 Dec, 2024
Academic Journal
Ho Park, J.; Shanker, N.; Cheema, S.; Hsu, S.; Varma, A.; Lee, C.; Garg, C.; Siker, U.; Wang, L.; Hu, C.; Salahuddin, S.
IEEE Electron Device Letters IEEE Electron Device Lett. Electron Device Letters, IEEE. 46(4):533-536 Apr, 2025
Academic Journal
Jiang, R.J.; Sang, G.Q.; Cao, L.; Yao, J.X.; Yang, K.; Lu, Y.H.; Zhang, X.X.; Wang, P.; Li, J.J.; He, X.B.; Zhou, N.; Zhang, Y.D.; Zhang, Z.H.; Zhang, C.C.; Li, L.L.; Li, Q.K.; Li, J.F.; Zhang, Q.Z.; Yin, H.X.; Luo, J.; Dai, B.W.
IEEE Electron Device Letters IEEE Electron Device Lett. Electron Device Letters, IEEE. 46(3):341-344 Mar, 2025
Academic Journal
IEEE Transactions on Device and Materials Reliability IEEE Trans. Device Mater. Relib. Device and Materials Reliability, IEEE Transactions on. 25(1):37-44 Mar, 2025
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