학술논문
'학술논문'
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Academic Journal
Tim M. Stevens (ORCID 0000-0002-6315-7633 ); Indira N. Z. Day (ORCID 0000-0002-5511-1061 ); Perry J. den Brok (ORCID 0000-0002-4945-763X ); Frans J. Prins (ORCID 0000-0002-7898-2978 ); Hanneke J. H. E. Assen (ORCID 0000-0002-4561-8221 ); Marlies ter Beek (ORCID 0000-0002-8021-0109 ); Gunter Bombaerts (ORCID 0000-0002-8006-1617 ); Remco Coppoolse; Petra H. M. Cremers (ORCID 0000-0002-8083-0850 ); Rik Engbers (ORCID 0000-0002-9170-7671 ); Madeleine Hulsen (ORCID 0000-0001-6601-4745 ); Rachelle J. A. Kamp (ORCID 0000-0001-9082-6970 ); Jur J. Koksma (ORCID 0000-0002-4682-1758 ); Kariene Mittendorff; Jan Riezebos (ORCID 0000-0002-3088-5300 ); Roeland M. van der Rijst (ORCID 0000-0002-6749-8283 ); Margje W. J. van de Wiel (ORCID 0000-0002-0785-7205 ); Jan D. Vermunt (ORCID 0000-0001-9110-4769 )
Academic Journal
Li, Taibo; Ferraro, Nicole; Strober, Benjamin J; Aguet, Francois; Kasela, Silva; Arvanitis, Marios; Ni, Bohan; Wiel, Laurens; Hershberg, Elliot; Ardlie, Kristin; Arking, Dan E; Beer, Rebecca L; Brody, Jennifer; Blackwell, Thomas W; Clish, Clary; Gabriel, Stacey; Gerszten, Robert; Guo, Xiuqing; Gupta, Namrata; Johnson, W Craig; Lappalainen, Tuuli; Lin, Henry J; Liu, Yongmei; Nickerson, Deborah A; Papanicolaou, George; Pritchard, Jonathan K; Qasba, Pankaj; Shojaie, Ali; Smith, Josh; Sotoodehnia, Nona; Taylor, Kent D; Tracy, Russell P; Van Den Berg, David; Wheeler, Matthew T; Rich, Stephen S; Rotter, Jerome I; Battle, Alexis; Montgomery, Stephen B
Cell Genomics. 3(10)
Academic Journal
IEEE Transactions on Instrumentation and Measurement IEEE Trans. Instrum. Meas. Instrumentation and Measurement, IEEE Transactions on. 72:1-12 2023
Report
Craig, Michael T.; Wohland, Jan; Stoop, Laurens P.; Kies, Alexander; Pickering, Bryn; Bloomfield, Hannah C.; Browell, Jethro; De Felice, Matteo; Dent, Chris J.; Deroubaix, Adrien; Frischmuth, Felix; Gonzalez, Paula L. M.; Grochowicz, Aleksander; Gruber, Katharina; Härtel, Philipp; Kittel, Martin; Kotzur, Leander; Labuhn, Inga; Lundquist, Julie K.; Pflugradt, Noah; van der Wiel, Karin; Zeyringer, Marianne; Brayshaw, David J.
Joule, 6(7), 1405-1417 (2022)
Conference
Smink, Alexander E.M.; de Jong, Maurits J.; Hilgenkamp, Hans; van der Wiel, Wilfred G.; Schmitz, Jurriaan
2020 IEEE 33rd International Conference on Microelectronic Test Structures (ICMTS) Microelectronic Test Structures (ICMTS), 2020 IEEE 33rd International Conference on. :1-4 May, 2020
Conference
2019 IEEE International Workshop on Metrology for Agriculture and Forestry (MetroAgriFor) Metrology for Agriculture and Forestry (MetroAgriFor), 2019 IEEE International Workshop on. :110-115 Oct, 2019
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[Author] Wiels J
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