부산대학교 도서관

Nomura, M.; Yoshimura, M.; Yokota, T.; Boku, S.; Oze, I.; Ishikawa, H.; Muto, M.

Immuno-Oncology and Technology. 28

Abdo, I.; Jyo, T.; Pander, A.; Wakita, H.; Shiratori, Y.; Muto, M.; Hamada, H.; Nagatani, M.; Gomez, C.d.; Wang, C.; Hatano, K.; Liu, C.; Fadila, A.A.; Pang, J.; Shirane, A.; Okada, K.; Takahashi, H.

IEEE Microwave and Wireless Technology Letters IEEE Microw. Wireless Tech. Lett. Microwave and Wireless Technology Letters, IEEE. 33(6):887-890 Jun, 2023

Sakanaka K; Fujii K; Ishida Y; Miyamoto S; Horimatsu T; Muto M; Mizowaki T

Cancer Management and Research, Vol 11, Pp 3623-3630 (2019)

Matsuda, T. ; Muto, M. ; Tamano, S.

In Journal of Non-Newtonian Fluid Mechanics July 2025 341

Muto, Masanaga; Chakraborty, Damayanti; Varberg, Kaela M.; Moreno-Irusta, Ayelen; Iqbal, Khursheed; Scott, Regan L.; McNally, Ross P.; Choudhury, Ruhul H.; Aplin, John D.; Okae, Hiroaki; Arima, Takahiro; Matsumoto, Shoma; Ema, Masatsugu; Mast, Alan E.; Grundberg, Elin; Soares, Michael J.

Proceedings of the National Academy of Sciences of the United States of America, 2021 Dec . 118(50), 1-12.

Varberg, Kaela M.; Iqbal, Khursheed; Muto, Masanaga; Simon, Mikaela E.; Scott, Regan L.; Kozai, Keisuke; Choudhury, Ruhul H.; Aplin, John D.; Biswell, Rebecca; Gibson, Margaret; Okae, Hiroaki; Arima, Takahiro; Vivian, Jay L.; Grundberg, Elin; Soares, Michael J.

Proceedings of the National Academy of Sciences of the United States of America, 2021 Mar 01. 118(10), 1-11.

Muto, M.; Tagawa, Y.

Achenbach, P.; Aoki, K.; Aoki, S.; Curceanu, C.; Diehl, S.; Doi, T.; Endo, M.; Fujita, M.; Fukuda, T.; Garcia-Tecocoatzi, H.; Geng, L. S.; Gunji, T.; Hanhart, C.; Harada, M.; Harada, T.; Hayakawa, S.; He, B. R.; Hiyama, E.; Honda, R.; Ichikawa, Y.; Isaka, M.; Jido, D.; Jinno, A.; Kamada, K.; Kamiya, Y.; Kong, Y. K.; Liu, Z. W.; Lu, J. X.; Miwa, K.; Mizutani, K.; Murakami, K.; Muto, R.; Murase, K.; Nagao, S.; Nanamura, T.; Nanjo, H.; Nara, Y.; Ohnishi, A.; Qiu, J. W.; Sakaguchi, A.; Sakuma, F.; Santopinto, E.; Scordo, A.; Sekihara, T.; Seong, C.; Shevchenko, N. V.; Stone, J. R.; Strakovsky, I.; Suzuki, K.; Takahashi, H.; Takizawa, M.; Tamura, H.; Tomida, N.; Umeya, A.; Doce, O. Vázquez; Yamagata-Sekihara, J.; Yamamoto, T. O.; Xiao, Y.; Yin, Z.; Yu, Z.; Zou, B. S.

Ginski, C.; Garufi, A.; Benisty, M.; Tazaki, R.; Dominik, C.; Ribas, A.; Engler, N.; Birnstiel, T.; Chauvin, G.; Columba, G.; Facchini, S.; Goncharov, A.; Hagelberg, J.; Henning, T.; Hogerheijde, M.; van Holstein, R. G.; Huang, J.; Muto, T.; Pinilla, P.; Kanagawa, K.; Kim, S.; Kurtovic, N.; Langlois, M.; Manara, C.; Milli, J.; Momose, M.; Orihara, R.; Pawellek, N.; Pinte, C.; Rab, C.; Schmidt, T. O. B.; Snik, F.; Wahhaj, Z.; Williams, J.; Zurlo, A.

Abe, K.; Haga, Y.; Hayato, Y.; Hiraide, K.; Ieki, K.; Ikeda, M.; Imaizumi, S.; Iyogi, K.; Kameda, J.; Kanemura, Y.; Kataoka, Y.; Kato, Y.; Kishimoto, Y.; Miki, S.; Mine, S.; Miura, M.; Mochizuki, T.; Moriyama, S.; Nagao, Y.; Nakahata, M.; Nakajima, T.; Nakano, Y.; Nakayama, S.; Okada, T.; Okamoto, K.; Orii, A.; Sato, K.; Sekiya, H.; Shiozawa, M.; Sonoda, Y.; Suzuki, Y.; Takeda, A.; Takemoto, Y.; Takenaka, A.; Tanaka, H.; Tasaka, S.; Tomura, T.; Ueno, K.; Watanabe, S.; Yano, T.; Yokozawa, T.; Han, S.; Irvine, T.; Kajita, T.; Kametani, I.; Kaneyuki, K.; Lee, K. P.; McLachlan, T.; Okumura, K.; Richard, E.; Tashiro, T.; Wang, R.; Xia, J.; Megias, G. D.; Bravo-Berguño, D.; Labarga, L.; Zaldivar, B.; Goldhaber, M.; Blaszczyk, F. d. M.; Gustafson, J.; Kachulis, C.; Kearns, E.; Raaf, J. L.; Stone, J. L.; Sulak, L. R.; Sussman, S.; Wan, L.; Wester, T.; Pointon, B. W.; Bian, J.; Carminati, G.; Elnimr, M.; Griskevich, N. J.; Kropp, W. R.; Locke, S.; Renshaw, A.; Smy, M. B.; Sobel, H. W.; Takhistov, V.; Weatherly, P.; Ganezer, K. S.; Hartfiel, B. L.; Hill, J.; Keig, W. E.; Hong, N.; Kim, J. Y.; Lim, I. T.; Park, R. G.; Akiri, T.; Bodur, B.; Himmel, A.; Li, Z.; O'Sullivan, E.; Scholberg, K.; Walter, C. W.; Wongjirad, T.; Bernard, L.; Coffani, A.; Drapier, O.; Hedri, S. El; Giampaolo, A.; Imber, J.; Mueller, Th. A.; Paganini, P.; Quilain, B.; Ishizuka, T.; Nakamura, T.; Jang, J. S.; Choi, K.; Learned, J. G.; Matsuno, S.; Smith, S. N.; Amey, J.; Anthony, L. H. V.; Litchfield, R. P.; Ma, W. Y.; Marin, D.; Sztuc, A. A.; Uchida, Y.; Wascko, M. O.; Berardi, V.; Catanesi, M. G.; Intonti, R. A.; Radicioni, E.; Calabria, N. F.; De Rosa, G.; Machado, L. N.; Collazuol, G.; Iacob, F.; Lamoureux, M.; Ospina, N.; Ludovici, L.; Gonin, M.; Pronost, G.; Maekawa, Y.; Nishimura, Y.; Cao, S.; Friend, M.; Hasegawa, T.; Ishida, T.; Ishii, T.; Jakkapu, M.; Kobayashi, T.; Matsubara, T.; Nakadaira, T.; Nakamura, K.; Oyama, Y.; Sakashita, K.; Sekiguchi, T.; Tsukamoto, T.; Boschi, T.; Di Lodovico, F.; Migenda, J.; Sedgwick, S. Molina; Taani, M.; Zsoldos, S.; Abe, KE.; Hasegawa, M.; Isobe, Y.; Kotsar, Y.; Miyabe, H.; Ozaki, H.; Shiozawa, T.; Sugimoto, T.; Suzuki, A. T.; Takeuchi, Y.; Yamamoto, S.; Ali, A.; Ashida, Y.; Bronner, C.; Feng, J.; Hayashino, T.; Hiraki, T.; Hirota, S.; Huang, K.; Jiang, M.; Kikawa, T.; Mori, M.; Murakami, A.; Nakamura, KE.; Nakaya, T.; Patel, N. D.; Suzuki, K.; Takahashi, S.; Tateishi, K.; Wendell, R. A.; Yasutome, K.; Fernandez, P.; McCauley, N.; Mehta, P.; Pritchard, A.; Tsui, K. M.; Fukuda, Y.; Itow, Y.; Menjo, H.; Mitsuka, G.; Murase, M.; Muto, F.; Niwa, T.; Tsukada, T. Suzuki M.; Frankiewicz, K.; Mijakowski, P.; Hignight, J.; Jiang, J.; Jung, C. K.; Li, X.; Palomino, J. L.; Santucci, G.; Vilela, C.; Wilking, M. J.; Yanagisawa, C.; Fukuda, D.; Hagiwara, K.; Harada, M.; Horai, T.; Ishino, H.; Ito, S.; Kayano, T.; Kibayashi, A.; Kitagawa, H.; Koshio, Y.; Ma, W.; Mori, T.; Nagata, H.; Piplani, N.; Sakai, S.; Sakuda, M.; Takahira, Y.; Xu, C.; Yamaguchi, R.; Kuno, Y.; Barr, G.; Barrow, D.; Cook, L.; Goldsack, A.; Samani, S.; Simpson, C.; Wark, D.; Nova, F.; Tacik, R.; Yang, J. Y.; Cole, A.; Jenkins, S. J.; Malek, M.; McElwee, J. M.; Stone, O.; Thiesse, M. D.; Thompson, L. F.; Okazawa, H.; Choi, Y.; Kim, S. B.; Yu, I.; Ichikawa, A. K.; Ito, K.; Nishijima, K.; Calland, R. G.; de Perio, P.; Martens, K.; Murdoch, M.; Vagins, M. R.; Koshiba, M.; Totsuka, Y.; Iwamoto, K.; Nakajima, Y.; Ogawa, N.; Suda, Y.; Yokoyama, M.; Hamabe, D.; Izumiyama, S.; Kuze, M.; Okajima, Y.; Tanaka, M.; Yoshida, T.; Inomoto, M.; Ishitsuka, M.; Ito, H.; Matsumoto, R.; Ohta, K.; Shinoki, M.; Martin, J. F.; Nantais, C. M.; Tanaka, H. A.; Towstego, T.; Akutsu, R.; Hartz, M.; Konaka, A.; Prouse, N. W.; Chen, S.; Xu, B. D.; Zhang, Y.; Berkman, S.; Tobayama, S.; Connolly, K.; Wilkes, R. J.; Posiadala-Zezula, M.; Hadley, D.; Richards, B.; Jamieson, B.; Walker, J.; Marti, Ll.; Minamino, A.; Pintaudi, G.; Sano, S.; Sasaki, R.

JINST 17 P10029 (2022)

Dissanayake, S. E.; Ye, F.; Tian, W.; Matsuda, M.; Muto, H.; Suzuki, S.; Nakano, T.; Watanabe, S.; Gouchi, J.; Uwatoko, Y.

Physical Review B 105, 245111 (2022)

Zhu, Zhaohuan; Bailey, Avery; Macías, Enrique; Muto, Takayuki; Andrews, Sean M.

Muto, Naoto; Abele, Hartmut; Ariga, Tomoko; Bosina, Joachim; Hino, Masahiro; Hirota, Katsuya; Ichikawa, Go; Jenke, Tobias; Kawahara, Hiroaki; Kawasaki, Shinsuke; Kitaguchi, Masaaki; Micko, Jakob; Mishima, Kenji; Naganawa, Naotaka; Nakamura, Mitsuhiro; Roccia, Stéphanie; Sato, Osamu; Sedmik, René I. P.; Seki, Yoshichika; Shimizu, Hirohiko M.; Tada, Satomi; Umemoto, Atsuhiro

Collaboration, Super-Kamiokande; Abe, K.; Bronner, C.; Haga, Y.; Hayato, Y.; Ikeda, M.; Imaizumi, S.; Ito, H.; Iyogi, K.; Kameda, J.; Kataoka, Y.; Kato, Y.; Kishimoto, Y.; Marti, Ll.; Miura, M.; Moriyama, S.; Mochizuki, T.; Nagao, Y.; Nakahata, M.; Nakajima, Y.; Nakajima, T.; Nakayama, S.; Okada, T.; Okamoto, K.; Orii, A.; Pronost, G.; Sekiya, H.; Shiozawa, M.; Sonoda, Y.; Takeda, A.; Takenaka, A.; Tanaka, H.; Tasaka, S.; Tomura, T.; Ueno, K.; Yano, T.; Yokozawa, T.; Akutsu, R.; Han, S.; Irvine, T.; Kajita, T.; Kametani, I.; Lee, K. P.; McLachlan, T.; Okumura, K.; Richard, E.; Tashiro, T.; Wang, R.; Xia, J.; Bravo-Berguño, D.; Labarga, L.; Fernandez, P.; Blaszczyk, F. d. M.; Gustafson, J.; Kachulis, C.; Kearns, E.; Raaf, J. L.; Stone, J. L.; Sulak, L. R.; Sussman, S.; Wan, L.; Wester, T.; Berkman, S.; Tobayama, S.; Bian, J.; Carminati, G.; Elnimr, M.; Griskevich, N. J.; Kropp, W. R.; Locke, S.; Mine, S.; Renshaw, A.; Smy, M. B.; Sobel, H. W.; Takhistov, V.; Weatherly, P.; Hartfiel, B. L.; Hill, J.; Keig, W. E.; Hong, N.; Kim, J. Y.; Lim, I. T.; Park, R. G.; Akiri, T.; Bodur, B.; Himmel, A.; Li, Z.; O'Sullivan, E.; Scholberg, K.; Walter, C. W.; Wongjirad, T.; Coffani, A.; Drapier, O.; Hedri, S. El; Giampaolo, A.; Gonin, M.; Imber, J.; Mueller, Th. A.; Paganini, P.; Quilain, B.; Ishizuka, T.; Nakamura, T.; Jang, J. S.; Choi, K.; Learned, J. G.; Matsuno, S.; Smith, S. N.; Amey, J.; Anthony, L. H. V.; Litchfield, R. P.; Ma, W. Y.; Sztuc, A. A.; Uchida, Y.; Wascko, M. O.; Berardi, V.; Catanesi, M. G.; Intonti, R. A.; Radicioni, E.; Calabria, N. F.; Machado, L. N.; De Rosa, G.; Collazuol, G.; Iacob, F.; Lamoureux, M.; Ospina, N.; Ludovici, L.; Boschi, T.; Di Lodovico, F.; Sedgwick, S. Molina; Zsoldos, S.; Nishimura, Y.; Cao, S.; Friend, M.; Hasegawa, T.; Ishida, T.; Ishii, T.; Kobayashi, T.; Nakadaira, T.; Nakamura, K.; Oyama, Y.; Sakashita, K.; Sekiguchi, T.; Tsukamoto, T.; Abe, KE.; Hasegawa, M.; Isobe, Y.; Miyabe, H.; Nakano, Y.; Shiozawa, T.; Sugimoto, T.; Suzuki, A. T.; Takeuchi, Y.; Yamamoto, S.; Ali, A.; Ashida, Y.; Hayashino, T.; Hiraki, T.; Hirota, S.; Huang, K.; Ieki, K.; Jiang, M.; Kikawa, T.; Mori, M.; Murakami, A.; Nakamura, KE.; Nakaya, T.; Patel, N. D.; Suzuki, K.; Takahashi, S.; Tateishi, K.; Wendell, R. A.; McCauley, N.; Mehta, P.; Pritchard, A.; Tsui, K. M.; Fukuda, Y.; Itow, Y.; Menjo, H.; Mitsuka, G.; Murase, M.; Muto, F.; Niwa, T.; Sato, K.; Suzuki, T.; Taani, M.; Tsukada, z M.; Mijakowski, P.; Frankiewicz, K.; Hignight, J.; Jung, C. K.; Li, X.; Palomino, J. L.; Santucci, G.; Vilela, C.; Wilking, M. J.; Yanagisawa, C.; Fukuda, D.; Hagiwara, K.; Harada, M.; Horai, T.; Ishino, H.; Ito, S.; Kayano, T.; Kibayashi, A.; Koshio, Y.; Ma, W.; Mori, T.; Nagata, H.; Piplani, N.; Sakuda, M.; Seiya, S.; Takahira, Y.; Xu, C.; Yamaguchi, R.; Kuno, Y.; Barr, G.; Barrow, D.; Cook, L.; Simpson, C.; Wark, D.; Nova, F.; Tacik, R.; Yang, J. Y.; Cole, A.; Jenkins, S. J.; McElwee, J.; Thiesse, M.; Thompson, L.; Okazawa, H.; Kim, S. B.; Choi, Y.; Ito, K.; Nishijima, K.; Iwamoto, K.; Koshiba, M.; Suda, Y.; Yokoyama, M.; Calland, R. G.; Goldsack, A.; Martens, K.; Murdoch, M.; Suzuki, Y.; Vagins, M. R.; Hamabe, D.; Kuze, M.; Okajima, Y.; Tanaka, M.; Yoshida, T.; Inomoto, M.; Ishitsuka, M.; Matsumoto, R.; Ohta, K.; Shinoki, M.; Martin, J. F.; Nantais, C. M.; Tanaka, H. A.; Towstego, T.; Hartz, M.; Konaka, A.; de Perio, P.; Prouse, N. W.; Chen, S.; Xu, B. D.; Zhang, Y.; Richards, B.; Connolly, K.; Wilkes, R. J.; Jamieson, B.; Walker, J.; Giorgio, P.; Minamino, A.; Pintaudi, G.

Phys. Rev. D 102, 072002 (2020)

Bartek, J. ; Biondi, A.; Bonhomme, V.; Castellan, L.; Catapano, G.; Cenzato, M.; Di Nuzzo, G.; De Robertis, E.; Giordano, F.; Iaccarino, C.; Kulcsar, Z.; Möhlenbruch, M.A.; Raabe, A.; Rickard, F.; Romero, C.S.; Schubert, T.; D, Shipway; Sicignano, C.; Muto, M.

In Brain and Spine 2024 4

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In The Lancet Diabetes & Endocrinology January 2024 12(1):39-50

Lo Presti, D.; Massaroni, C.; Formica, D.; Giurazza, F.; Schena, E.; Saccomandi, P.; Caponero, M. A.; Muto, M.

2017 IEEE International Instrumentation and Measurement Technology Conference (I2MTC) Instrumentation and Measurement Technology Conference (I2MTC), 2017 IEEE International. :1-6 May, 2017

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