부산대학교 도서관

몽흐에르뎅 / Erdenebat Munkh-Erdene

몽공졸 / Erdenebat Mungunzul

Erdenebat Mungunzul; Taikoo Chang

International Journal of u- and e- Service, Science and Technology, 03/31/2016, Vol. 9, Issue 3, p. 249-258

Erdenebat MU; School of Information and Communication Engineering, Chungbuk National University, Chungbuk 28644, Republic of Korea.; Amgalan T; School of Information and Communication Engineering, Chungbuk National University, Chungbuk 28644, Republic of Korea.; Khuderchuluun A; School of Information and Communication Engineering, Chungbuk National University, Chungbuk 28644, Republic of Korea.; Nam OS; School of Information and Communication Engineering, Chungbuk National University, Chungbuk 28644, Republic of Korea.; Jeon SH; Department of Electronics Engineering, Incheon National University, Incheon 22012, Republic of Korea.; Kwon KC; School of Information and Communication Engineering, Chungbuk National University, Chungbuk 28644, Republic of Korea.; Kim N; School of Information and Communication Engineering, Chungbuk National University, Chungbuk 28644, Republic of Korea.

Publisher: MDPI Country of Publication: Switzerland NLM ID: 101204366 Publication Model: Electronic Cited Medium: Internet ISSN: 1424-8220 (Electronic) Linking ISSN: 14248220 NLM ISO Abbreviation: Sensors (Basel) Subsets: PubMed not MEDLINE; MEDLINE

Kwon KH; School of Electronic and Electrical Engineering, Kyungpook National University, Daegu 41566, Republic of Korea.; Erdenebat MU; School of Information and Communication Engineering, Chungbuk National University, Cheongju 28644, Republic of Korea.; Kim N; School of Information and Communication Engineering, Chungbuk National University, Cheongju 28644, Republic of Korea.; Khuderchuluun A; School of Information and Communication Engineering, Chungbuk National University, Cheongju 28644, Republic of Korea.; Imtiaz SM; School of Information and Communication Engineering, Chungbuk National University, Cheongju 28644, Republic of Korea.; Kim MY; School of Electronic and Electrical Engineering, Kyungpook National University, Daegu 41566, Republic of Korea.; Kwon KC; School of Information and Communication Engineering, Chungbuk National University, Cheongju 28644, Republic of Korea.

Publisher: MDPI Country of Publication: Switzerland NLM ID: 101204366 Publication Model: Electronic Cited Medium: Internet ISSN: 1424-8220 (Electronic) Linking ISSN: 14248220 NLM ISO Abbreviation: Sensors (Basel) Subsets: PubMed not MEDLINE; MEDLINE

Kwon KC; Erdenebat MU; Khuderchuluun A; Kwon KH; Kim MY; Kim N

Publisher: Optica Publishing Group Country of Publication: United States NLM ID: 7708433 Publication Model: Print Cited Medium: Internet ISSN: 1539-4794 (Electronic) Linking ISSN: 01469592 NLM ISO Abbreviation: Opt Lett Subsets: PubMed not MEDLINE; MEDLINE

Rosen J; School of Electrical and Computer Engineering, Ben-Gurion University of the Negev, P.O. Box 653, Beer-Sheva 8410501, Israel.; Alford S; Department of Anatomy and Cell Biology, University of Illinois at Chicago, 808 South Wood Street, Chicago, IL 60612, USA.; Anand V; Optical Sciences Centre and ARC Training Centre in Surface Engineering for Advanced Materials (SEAM), School of Science, Swinburne University of Technology, Hawthorn, VIC 3122, Australia.; Art J; Department of Anatomy and Cell Biology, University of Illinois at Chicago, 808 South Wood Street, Chicago, IL 60612, USA.; Bouchal P; Institute of Physical Engineering, Faculty of Mechanical Engineering, Brno University of Technology, Tech-nická 2, 619 69 Brno, Czech Republic.; Central European Institute of Technology, Brno University of Technology, Purkyňova 656/123, 612 00 Brno, Czech Republic.; Bouchal Z; Department of Optics, Palacký University, 17. Listopadu 1192/12, 771 46 Olomouc, Czech Republic.; Erdenebat MU; School of Information and Communication Engineering, Chungbuk National University, 1 Chungdae-ro, Seowon-gu, Cheongju 28644, Chungbuk, Korea.; Huang L; Beijing Engineering Research Center of Mixed Reality and Advanced Display, School of Optics and Photonics, Beijing Institute of Technology, Beijing 100081, China.; Ishii A; Faculty of Life & Environmental Sciences, Teikyo University of Science, 2525 Yatsuzawa, Uenohara, Yamanashi 409-0193, Japan.; PRESTO, Japan Science and Technology Agency, 4-1-8 Honcho, Kawaguchi 332-0012, Saitama, Japan.; Juodkazis S; Optical Sciences Centre and ARC Training Centre in Surface Engineering for Advanced Materials (SEAM), School of Science, Swinburne University of Technology, Hawthorn, VIC 3122, Australia.; Tokyo Tech World Research Hub Initiative (WRHI), School of Materials and Chemical Technology, Tokyo Institute of Technology, 2-12-1, Ookayama, Meguro-ku, Tokyo 152-8550, Japan.; Kim N; School of Information and Communication Engineering, Chungbuk National University, 1 Chungdae-ro, Seowon-gu, Cheongju 28644, Chungbuk, Korea.; Kner P; School of Electrical and Computer Engineering, University of Georgia, Athens, GA 30602, USA.; Koujin T; Advanced ICT Research Institute Kobe, National Institute of Information and Communications Technology, 588-2 Iwaoka, Iwaoka-cho, Nishi-ku, Kobe 651-2492, Japan.; Kozawa Y; Institute of Multidisciplinary Research for Advanced Materials, Tohoku University, 2-1-1 Katahira, Aoba-ku, Sendai 980-8577, Japan.; Liang D; School of Physics Science and Engineering, Tongji University, Shanghai 200092, China.; State Key Laboratory of High Field Laser Physics, Shanghai Institute of Optics and Fine Mechanics, Chinese Academy of Sciences, Shanghai 201800, China.; Center of Materials Science and Optoelectronics Engineering, University of Chinese Academy of Sciences, Beijing 100049, China.; Liu J; State Key Laboratory of High Field Laser Physics, Shanghai Institute of Optics and Fine Mechanics, Chinese Academy of Sciences, Shanghai 201800, China.; Center of Materials Science and Optoelectronics Engineering, University of Chinese Academy of Sciences, Beijing 100049, China.; Mann C; Department of Applied Physics and Materials Science, Northern Arizona University, Flagstaff, AZ 86011, USA.; Center for Materials Interfaces in Research and Development, Northern Arizona University, Flagstaff, AZ 86011, USA.; Marar A; Wallace H. Coulter Department of Biomedical Engineering, Georgia Institute of Technology and Emory University, Atlanta, GA 30332, USA.; Matsuda A; Advanced ICT Research Institute Kobe, National Institute of Information and Communications Technology, 588-2 Iwaoka, Iwaoka-cho, Nishi-ku, Kobe 651-2492, Japan.; Nobukawa T; Science & Technology Research Laboratories, Japan Broadcasting Corporation (NHK), 1-10-11 Kinuta, Setagaya-ku, Tokyo 157-8510, Japan.; Nomura T; Faculty of Systems Engineering, Wakayama University, Sakaedani 930, Wakayama 640-8510, Japan.; Oi R; Applied Electromagnetic Research Center, Radio Research Institute, National Institute of Information and Communications Technology (NICT), 4-2-1 Nukuikitamachi, Koganei, Tokyo 184-8795, Japan.; Potcoava M; Department of Anatomy and Cell Biology, University of Illinois at Chicago, 808 South Wood Street, Chicago, IL 60612, USA.; Tahara T; Applied Electromagnetic Research Center, Radio Research Institute, National Institute of Information and Communications Technology (NICT), 4-2-1 Nukuikitamachi, Koganei, Tokyo 184-8795, Japan.; Thanh BL; Viettel High Technology Industries Corporation, 380 Lac Long Quan Street, Hoan Kiem, Hanoi 100000, Vietnam.; Zhou H; Beijing Engineering Research Center of Mixed Reality and Advanced Display, School of Optics and Photonics, Beijing Institute of Technology, Beijing 100081, China.

Publisher: MDPI Country of Publication: Switzerland NLM ID: 101698819 Publication Model: Electronic Cited Medium: Internet ISSN: 2313-433X (Electronic) Linking ISSN: 2313433X NLM ISO Abbreviation: J Imaging Subsets: PubMed not MEDLINE

Darkhanbaatar N; Erdenebat MU; Shin CW; Kwon KC; Lee KY; Baasantseren G; Kim N

Publisher: Optica Publishing Group Country of Publication: United States NLM ID: 0247660 Publication Model: Print Cited Medium: Internet ISSN: 1539-4522 (Electronic) Linking ISSN: 1559128X NLM ISO Abbreviation: Appl Opt Subsets: PubMed not MEDLINE; MEDLINE

Khuderchuluun A; Piao YL; Erdenebat MU; Dashdavaa E; Lee MH; Jeon SH; Kim N

Publisher: Optica Publishing Group Country of Publication: United States NLM ID: 0247660 Publication Model: Print Cited Medium: Internet ISSN: 1539-4522 (Electronic) Linking ISSN: 1559128X NLM ISO Abbreviation: Appl Opt Subsets: PubMed not MEDLINE; MEDLINE

Alam MS; Department of Computer and Communication Engineering, Chungbuk National University, Cheongju, Chungbuk 28644, Korea.; Kwon KC; Department of Computer and Communication Engineering, Chungbuk National University, Cheongju, Chungbuk 28644, Korea.; Erdenebat MU; Department of Computer and Communication Engineering, Chungbuk National University, Cheongju, Chungbuk 28644, Korea.; Y Abbass M; Department of Computer and Communication Engineering, Chungbuk National University, Cheongju, Chungbuk 28644, Korea.; Alam MA; Department of Computer Science and Engineering, BRAC University, Dhaka 1212, Bangladesh.; Kim N; Department of Computer and Communication Engineering, Chungbuk National University, Cheongju, Chungbuk 28644, Korea.

Publisher: MDPI Country of Publication: Switzerland NLM ID: 101204366 Publication Model: Electronic Cited Medium: Internet ISSN: 1424-8220 (Electronic) Linking ISSN: 14248220 NLM ISO Abbreviation: Sensors (Basel) Subsets: PubMed not MEDLINE; MEDLINE