학술논문
'학술논문'
에서 검색결과 10건 | 목록
1~10
Conference
Agostinelli, M.; Hicks, J.; Xu, J.; Woolery, B.; Mistry, K.; Zhang, K.; Jacobs, S.; Jopling, J.; Yang, W.; Lee, B.; Raz, T.; Mehalel, M.; Kolar, P.; Wang, Y.; Sandford, J.; Pivin, D.; Peterson, C.; DiBattista, M.; Pae, S.; Jones, M.; Johnson, S.; Subramanian, G.
IEEE InternationalElectron Devices Meeting, 2005. IEDM Technical Digest. International Electron Devices Meeting 2005 Electron Devices Meeting, 2005. IEDM Technical Digest. IEEE International. :655-658 2005
Conference
Bai, P.; Auth, C.; Balakrishnan, S.; Bost, M.; Brain, R.; Chikarmane, V.; Heussner, R.; Hussein, M.; Hwang, J.; Ingerly, D.; James, R.; Jeong, J.; Kenyon, C.; Lee, E.; Lee, S.-H.; Lindert, N.; Liu, M.; Ma, Z.; Marieb, T.; Murthy, A.; Nagisetty, R.; Natarajan, S.; Neirynck, J.; Ott, A.; Parker, C.; Sebastian, J.; Shaheed, R.; Sivakumar, S.; Steigerwald, J.; Tyagi, S.; Weber, C.; Woolery, B.; Yeoh, A.; Zhang, K.; Bohr, M.
IEDM Technical Digest. IEEE International Electron Devices Meeting, 2004. Electron devices meeting Electron Devices Meeting, 2004. IEDM Technical Digest. IEEE International. :657-660 2004
Academic Journal
IEEE Transactions on Device and Materials Reliability IEEE Trans. Device Mater. Relib. Device and Materials Reliability, IEEE Transactions on. 8(3):519-525 Sep, 2008
Conference
Rahman, A.; Bai, P.; Curello, G.; Hicks, J.; Jan, C. -H.; Jamil, M.; Park, J.; Phoa, K.; Rahman, M. S.; Tsai, C.; Woolery, B.; Yeh, J.-Y.
2013 IEEE International Reliability Physics Symposium (IRPS) Reliability Physics Symposium (IRPS), 2013 IEEE International. :PI.2.1-PI.2.6 Apr, 2013
Conference
Pae, S.; Prasad, C.; Ramey, S.; Thomas, J.; Rahman, A.; Lu, R.; Hicks, J.; Batzer, S.; Zhao, Q.; Hatfield, J.; Liu, M.; Parker, C.; Woolery, B.
2012 IEEE International Reliability Physics Symposium (IRPS) Reliability Physics Symposium (IRPS), 2012 IEEE International. :5C.1.1-5C.1.5 Apr, 2012
Conference
Sangwoo Pae; Ashok, A.; Jingyoo Choi; Ghani, T.; Jun He; Seok-hee Lee; Lemay, K.; Liu, M.; Lu, R.; Packan, P.; Parker, C.; Purser, R.; St. Amour, A.; Woolery, B.
2010 IEEE International Reliability Physics Symposium (IRPS); 2010, p287-292, 6p
Academic Journal
IEEE Transactions on Device & Materials Reliability; Sep2008, Vol. 8 Issue 3, p519-525, 7p
Conference
Pae, S.; Ghani, T.; He, J.; Lee, S.-H.; Liu, M.; Lu, R.; Packan, P.; Parker, C.; Amour, A.S.; Woolery, B.; Ashok, A.; Lemay, K.; Purser, R.; Choi, J.
In: IEEE International Reliability Physics Symposium Proceedings , 2010 IEEE International Reliability Physics Symposium, IRPS 2010. (IEEE International Reliability Physics Symposium Proceedings, 2010, :287-292)
Conference
Bai, P.; Auth, C.; Balakrishnan, S.; Bost, M.; Brain, R.; Chikarmane, V.; Heussner, R.; Hussein, M.; Hwang, J.; Ingerly, D.; James, R.; Jeong, J.; Kenyon, C.; Lee, E.; Lee, S.-H.; Lindert, N.; Liu, M.; Murthy, A.; Nagisetty, R.; Natarajan, S.; Neirynck, J.; Ott, A.; Parker, C.; Sebastian, J.; Sivakumar, S.; Steigerwald, J.; Tyagi, S.; Yeoh, A.; Zhang, K.; Bohr, M.; Ma, Z.; Marieb, T.; Woolery, B.; Shaheed, R.; Weber, C.
In: Technical Digest - International Electron Devices Meeting, IEDM , Technical Digest - IEEE International Electron Devices Meeting, 2004 IEDM (50th Annual Meeting). (Technical Digest - International Electron Devices Meeting, IEDM, 2004, :657-660)
Academic Journal
In: Communications News . (Communications News, March 2009, 46(3):26-27)
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제한된 항목
[AR] Woolery, B.
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