학술논문
'학술논문'
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1~10
Conference
Simon, Jeffrey; Mun, Noah; George, Anthony; Baur, Josh; Busch, James; Meadows, Christian; Liszewski, Katie; Boona, Isabel; Wickey, Kurtis; Kent, Thomas; Kimura, Adam; McCue, Jamin; Via, Glen David; Dupaix, Brian
2021 IEEE Physical Assurance and Inspection of Electronics (PAINE) Physical Assurance and Inspection of Electronics (PAINE), 2021 IEEE. :1-7 Nov, 2021
Conference
Waite, Adam R.; Patel, Yash; Kelley, John J.; Scholl, Jonathan H.; Baur, Joshua; Kimura, Adam; Udelhoven, Eric D.; Via, Glen David; Ott, Richard; Brooks, Daniel L.
2021 IEEE Physical Assurance and Inspection of Electronics (PAINE) Physical Assurance and Inspection of Electronics (PAINE), 2021 IEEE. :1-6 Nov, 2021
Conference
Scholl, Jonathan; Patel, Yash; Baur, Joshua; Kimura, Adam; Waite, Adam; Kelley, John; Via, Glen David
2020 IEEE Physical Assurance and Inspection of Electronics (PAINE) Physical Assurance and Inspection of Electronics (PAINE), 2020 IEEE. :1-5 Dec, 2020
Academic Journal
Patel, Yash; Baur, Joshua; Scholl, Jonathan; Waite, Adam R.; Kimura, Adam; Kelley, John; Ott, Richard; Via, Glen David
Periodical
Kimura, Adam; Scholl, Jon; Schaffranek, James; Sutter, Matthew; Elliott, Andrew; Strizich, Mike; Via, Glen David
Journal of Hardware and Systems Security; March 2020, Vol. 4 Issue: 1 p34-43, 10p
Academic Journal
Chao, Pane-Chane; Chu, Kenneth; Creamer, Carlton; Diaz, Jose; Yurovchak, Tom; Shur, Michael; Kallaher, Ray; McGray, Craig; Via, Glen David; Blevins, John D.
Academic Journal
Academic Journal
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[AR] Via, Glen David
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