학술논문
'학술논문'
에서 검색결과 360건 | 목록
1~10
Academic Journal
IEEE Transactions on Visualization and Computer Graphics IEEE Trans. Visual. Comput. Graphics Visualization and Computer Graphics, IEEE Transactions on. 30(7):4023-4038 Jul, 2024
Academic Journal
In: PLoS ONE . (PLoS ONE, July 2024, 19(7 July))
Academic Journal
In: Demography . (Demography, 1 June 2024, 61(3):643-664)
Academic Journal
Opdebeeck, B.; Van Den Branden, A.; Adriaensen, S.; Geryl, H.; D'Haese, P.C.; Verhulst, A.; Orriss, I.R.; Patel, J.J.; Zwijsen, K.
In: JBMR Plus . (JBMR Plus, June 2024, 8(6))
Academic Journal
Erchick, D.J.; Lama, T.P.; Subedi, S.; LeClerq, S.C.; Katz, J.; Khatry, S.K.; Verhulst, A.; Guillot, M.; Tielsch, J.M.; Mullany, L.C.
In: Journal of Health, Population and Nutrition . (Journal of Health, Population and Nutrition, December 2023, 42(1))
Academic Journal
Erchick, D.J.; Subedi, S.; Christian, P.; Humphrey, J.H.; Mullany, L.C.; Wu, L.S.F.; Katz, J.; Verhulst, A.; Guillot, M.; Adair, L.S.; Barros, A.J.D.; da Silva, B.G.C.; Silveira, M.F.; Hallal, P.C.; Menezes, A.M.B.; Santos, I.S.; Chasekwa, B.; Huybregts, L.; Kariuki, S.; Khatry, S.K.; Lachat, C.; Matijasevich, A.; McElroy, P.D.; Perez, T.L.L.; Phillips-Howard, P.A.; Roberfroid, D.; ter Kuile, F.O.; Ravilla, T.D.; Tielsch, J.M.
In: Population Health Metrics . (Population Health Metrics, December 2023, 21(1))
Conference
2021 IEEE International Symposium on Mixed and Augmented Reality (ISMAR) ISMAR Mixed and Augmented Reality (ISMAR), 2021 IEEE International Symposium on. :320-328 Oct, 2021
Academic Journal
Jungemann, C.; Bonani, F.; Cea, S.M.; Gnani, E.; Hong, S.; Jin, S.; Liu, X.; Moroz, V.; Verhulst, A.
IEEE Transactions on Electron Devices IEEE Trans. Electron Devices Electron Devices, IEEE Transactions on. 68(11):5346-5349 Nov, 2021
Academic Journal
Collaert, N.; Alian, A.; Arimura, H.; Boccardi, G.; Eneman, G.; Franco, J.; Ivanov, Ts.; Lin, D.; Loo, R.; Merckling, C.; Mitard, J.; Pourghaderi, M.A.; Rooyackers, R.; Sioncke, S.; Sun, J.W.; Vandooren, A.; Veloso, A.; Verhulst, A.; Waldron, N.; Witters, L.; Zhou, D.; Barla, K.; Thean, A.V.-Y.
In Microelectronic Engineering 25 January 2015 132:218-225
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[AR] Verhulst, A.
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