학술논문
'학술논문'
에서 검색결과 134건 | 목록
1~10
Performance improvement in narrow MuGFETs by gate work function and source/drain implant engineering
Academic Journal
Ferain, I.; Duffy, R.; Collaert, N.; van Dal, M.J.H.; Pawlak, B.J.; O’Sullivan, B.; Witters, L.; Rooyackers, R.; Conard, T.; Popovici, M.; van Elshocht, S.; Kaiser, M.; Weemaes, R.G.R.; Swerts, J.; Jurczak, M.; Lander, R.J.P.; De Meyer, K.
In Solid State Electronics 2009 53(7):760-766
Academic Journal
Collaert, N.; De Keersgieter, A.; Dixit, A.; Ferain, I.; Lai, L.-S.; Lenoble, D.; Mercha, A.; Nackaerts, A.; Pawlak, B.J.; Rooyackers, R.; Schulz, T.; San, K.T.; Son, N.J.; Van Dal, M.J.H.; Verheyen, P.; von Arnim, K.; Witters, L.; De Meyer, K.; Biesemans, S.; Jurczak, M.
In Solid State Electronics September 2008 52(9):1291-1296
Academic Journal
Kittl, J.A.; Opsomer, K.; Torregiani, C.; Demeurisse, C.; Mertens, S.; Brunco, D.P.; Van Dal, M.J.H.; Lauwers, A.
In Materials Science & Engineering B 2008 154:144-154
Academic Journal
Lauwers, A.; van Dal, M.J.H.; Verheyen, P.; Chamirian, O.; Demeurisse, C.; Mertens, S.; Vrancken, C.; Verheyden, K.; Funk, K.; Kittl, J.A.
In Microelectronic Engineering 2006 83(11):2268-2271
Academic Journal
Kittl, J.A.; Pawlak, M.A.; Lauwers, A.; Demeurisse, C.; Hoffmann, T.; Veloso, A.; Anil, K.G.; Kubicek, S.; Niwa, M.; van Dal, M.J.H.; Richard, O.; Jurczak, M.; Vrancken, C.; Chiarella, T.; Brus, S.; Maex, K.; Biesemans, S.
In Microelectronic Engineering 2006 83(11):2117-2121
Conference
van Dal, M.J.H.; Vellianitis, G.; Doornbos, G.; Duriez, B.; Holland, M.C.; Vasen, T.; Afzalian, A.; Chen, E.; Su, S.K.; Chen, T.K.; Shen, T.M.; Wu, Z.Q.; Diaz, C.H.
2018 IEEE International Electron Devices Meeting (IEDM) Electron Devices Meeting (IEDM), 2018 IEEE International. :21.1.1-21.1.4 Dec, 2018
Conference
2006 IEEE International Conference on Microelectronic Test Structures Microelectronic Test Structures Microelectronic Test Structures, 2006. ICMTS 2006. IEEE International Conference on. :13-17 2006
Academic Journal
In Acta Materialia 2000 48(2):385-396
Conference
Vasen, T.; Ramvall, P.; Afzalian, A.; Thelander, C.; Dick, K.A.; Holland, M.; Doornbos, G.; Wang, S.W.; Oxland, R.; Vellianitis, G.; van Dal, M.J.H.; Duriez, B.; Ramirez, J.-R.; Droopad, R.; Wernersson, L.-E.; Samuelson, L.; Chen, T.-K.; Yeo, Y.-C.; Passlack, M.
2016 IEEE Symposium on VLSI Technology VLSI Technology, 2016 IEEE Symposium on. :1-2 Jun, 2016
Academic Journal
IEEE Transactions on Electron Devices IEEE Trans. Electron Devices Electron Devices, IEEE Transactions on. 53(5):1180-1185 May, 2006
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제한된 항목
[AR] Van Dal, M.J.H.
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