학술논문

발행년
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(예 : 2010-2015)
'학술논문' 에서 검색결과 113건 | 목록 1~10
Academic Journal
In: Journal of Investigational Allergology and Clinical Immunology. (Journal of Investigational Allergology and Clinical Immunology, 2024, 34(2):106-117)
Conference
Proceedings of the 11th International Symposium on the Physical and Failure Analysis of Integrated Circuits. IPFA 2004 (IEEE Cat. No.04TH8743) Physical and failure analysis of integrated circuits Physical and Failure Analysis of Integrated Circuits, 2004. IPFA 2004. Proceedings of the 11th International Symposium on the. :177-180 2004
Conference
Proceedings of the 11th International Symposium on the Physical and Failure Analysis of Integrated Circuits. IPFA 2004 (IEEE Cat. No.04TH8743) Physical and failure analysis of integrated circuits Physical and Failure Analysis of Integrated Circuits, 2004. IPFA 2004. Proceedings of the 11th International Symposium on the. :169-172 2004
Conference
Proceedings of the 11th International Symposium on the Physical and Failure Analysis of Integrated Circuits. IPFA 2004 (IEEE Cat. No.04TH8743) Physical and failure analysis of integrated circuits Physical and Failure Analysis of Integrated Circuits, 2004. IPFA 2004. Proceedings of the 11th International Symposium on the. :315-318 2004
Conference
2004 IEEE International Reliability Physics Symposium. Proceedings Reliability physics Reliability Physics Symposium Proceedings, 2004. 42nd Annual. 2004 IEEE International. :229-233 2004
Conference
IEEE International Integrated Reliability Workshop Final Report, 2002. Integrated reliability Integrated Reliability Workshop Final Report, 2002. IEEE International. :50-54 2002
Academic Journal
IEEE Transactions on Electron Devices IEEE Trans. Electron Devices Electron Devices, IEEE Transactions on. 52(12):2602-2608 Dec, 2005
Conference
2009 IEEE International Reliability Physics Symposium Reliability Physics Symposium, 2009 IEEE International. :229-235 Apr, 2009
Conference
ICMTS 1998. Proceedings of 1998 International Conference on Microelectronic Test Structures (Cat. No.98CH36157) Microelectronic test structures Microelectronic Test Structures, 1998. ICMTS 1998., Proceedings of the 1998 International Conference on. :189-191 1998
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제한된 항목
[AR] Su, K.C.
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