학술논문
'학술논문'
에서 검색결과 7건 | 목록
1~10
Academic Journal
In: Frontiers in Sociology . (Frontiers in Sociology, 2024, 9)
Conference
Park, J.; Nam, Y.; Kim, S.; Hwang, H.; Kong, J.H.; Yun, S.-H.; Kang, Y.; op 't Root, W.; Klaassen, B.; van den Bos, K.; Hou, Z.; Soco, A.; Cheon, D.; Yim, J.-H.; Song, H.-S.; Baek, M.-Y.
In: Proceedings of SPIE - The International Society for Optical Engineering , Metrology, Inspection, and Process Control XXXVIII. (Proceedings of SPIE - The International Society for Optical Engineering, 2024, 12955)
Conference
Lee, D.; Lee, J.; Lee, E.; Lee, J.; Lee, S.Y.; Hwang, C.; Kapel, P.; Bettink, J.W.; Soco, A.; Zwier, O.; Van Witteveen, K.; Yang, S.-B.; Baek, M.-Y.; Jeon, S.-R.; Kim, T.
In: Proceedings of SPIE - The International Society for Optical Engineering , Metrology, Inspection, and Process Control XXXVI. (Proceedings of SPIE - The International Society for Optical Engineering, 2022, 12053)
Conference
Lee, M.; Kim, J.; Park, D.; Han, Y.; Yoon, J.; Lee, S.Y.; Hwang, C.; Woessner, A.; Tabery, C.E.; Wang, M.; Corradi, A.; Song, Y.-H.; Sung, Y.-A.; Kim, T.; Soco, A.; Kim, J.; Hsieh, C.-H.
In: Proceedings of SPIE - The International Society for Optical Engineering , Metrology, Inspection, and Process Control XXXVI. (Proceedings of SPIE - The International Society for Optical Engineering, 2022, 12053)
Conference
Lee, H.-G.; Lee, D.-Y.; Kim, J.-Y.; Han, S.-J.; Park, C.-H.; Karssenberg, J.; Shahrjerdy, M.; Van Leest, A.; Soco, A.; Nooitgedagt, T.; Oh, N.-L.; Lee, D.-H.
In: Proceedings of SPIE - The International Society for Optical Engineering , Metrology, Inspection, and Process Control for Microlithography XXXIII. (Proceedings of SPIE - The International Society for Optical Engineering, 2019, 10959)
Conference
Park, D.-K.; Kim, H.-S.; Seo, M.-Y.; Ju, J.-W.; Kim, Y.-S.; Shahrjerdy, M.; Van Leest, A.; Soco, A.; Miceli, G.; Massier, J.; McNamara, E.; Hinnen, P.; Böcker, P.; Oh, N.-L.; Jung, S.-H.; Chai, Y.; Lee, J.-H.
In: Proceedings of SPIE - The International Society for Optical Engineering , Metrology, Inspection, and Process Control for Microlithography XXXII. (Proceedings of SPIE - The International Society for Optical Engineering, 2018, 10585)
Conference
Chen, K.-H.; Huang, G.-T.; Hsieh, H.-C.; Ni, W.-F.; Chuang, S.M.; Chuang, T.K.; Ke, C.-M.; Huang, J.; Rao, S.-A.; Cumurcu Gysen, A.; D'Alfonso, M.; Yueh, J.; Izikson, P.; Soco, A.; Wu, J.; Nooitgedagt, T.; Ottens, J.; Kim, Y.H.; Ebert, M.
In: Proceedings of SPIE - The International Society for Optical Engineering , Metrology, Inspection, and Process Control for Microlithography XXXI. (Proceedings of SPIE - The International Society for Optical Engineering, 2017, 10145)
검색 결과 제한하기
제한된 항목
[AR] Soco, A.
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