학술논문

발행년
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(예 : 2010-2015)
'학술논문' 에서 검색결과 17건 | 목록 1~10
Conference
2010 IEEE International 3D Systems Integration Conference (3DIC) 3D Systems Integration Conference (3DIC), 2010 IEEE International. :1-6 Nov, 2010
Conference
Proceedings of the 9th International Symposium on the Physical and Failure Analysis of Integrated Circuits (Cat. No.02TH8614) Physical and failure analysis of integrated circuits Physical and Failure Analysis of Integrated Circuits, 2002. IPFA 2002. Proceedings of the 9th International Symposium on the. :111-117 2002
Conference
2010 IEEE International Interconnect Technology Conference Interconnect Technology Conference (IITC), 2010 International. :1-3 Jun, 2010
Conference
Proceedings of the 9th International Symposium on the Physical & Failure Analysis of Integrated Circuits (Cat. No.02TH8614); 2002, p111-117, 7p
Conference
In: Conference Proceedings from the International Symposium for Testing and Failure Analysis, ISTFA 2016 - Conference Proceedings from the 42nd International Symposium for Testing and Failure Analysis. (Conference Proceedings from the International Symposium for Testing and Failure Analysis, 2016, :574-579)
Conference
In: Conference Proceedings from the International Symposium for Testing and Failure Analysis, ISTFA 2014 - Conference Proceedings from the 40th International Symposium for Testing and Failure Analysis. (Conference Proceedings from the International Symposium for Testing and Failure Analysis, 2014, 2014-January(January):474-479)
Conference
In: Conference Proceedings from the International Symposium for Testing and Failure Analysis, ISTFA 2014 - Conference Proceedings from the 40th International Symposium for Testing and Failure Analysis. (Conference Proceedings from the International Symposium for Testing and Failure Analysis, 2014, 2014-January(January):278-283)
Conference
In: Proceedings of SPIE - The International Society for Optical Engineering, Metrology, Inspection, and Process Control for Microlithography XXVII. (Proceedings of SPIE - The International Society for Optical Engineering, 2013, 8681)
Conference
In: Conference Proceedings from the International Symposium for Testing and Failure Analysis, ISTFA 2010 - Conference Proceedings from the 36th International Symposium for Testing and Failure Analysis. (Conference Proceedings from the International Symposium for Testing and Failure Analysis, 2010, :186-190)
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제한된 항목
[AR] Senowitz, C.
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