학술논문
'학술논문'
에서 검색결과 152건 | 목록
1~10
Ip2go: An Interior Point Source Code Generator for Solving Linear-Quadratic Optimal Control Problems
Academic Journal
In IFAC PapersOnLine July 2017 50(1):10632-10637
Academic Journal
In: Geschichte und Gesellschaft . (Geschichte und Gesellschaft, October 2022, 48(3):428-460)
Academic Journal
Nirschl, Th.; Henzler, St.; Fischer, J.; Fulde, M.; Bargagli-Stoffi, A.; Sterkel, M.; Sedlmeir, J.; Weber, C.; Heinrich, R.; Schaper, U.; Einfeld, J.; Neubert, R.; Feldmann, U.; Stahrenberg, K.; Ruderer, E.; Georgakos, G.; Huber, A.; Kakoschke, R.; Hansch, W.; Schmitt-Landsiedel, D.
In Solid State Electronics 2006 50(1):44-51
Academic Journal
Nirschl, Th.; Ostermayr, M.; Olbrich, A.; Vietzke, D.; Omer, M.; Linnenbank, C.; Schaper, U.; Pottgiesser, Y.; Pottgiesser, J.; Johansson, M.; Simon, U.; Joens, A.
In Microelectronics Reliability 2003 43(9):1383-1387
Conference
Nirschl, T.; Schaper, U.; Einfeld, J.; Henzler, S.; Sterkel, M.; Singer, J.; Fulde, M.; Hansch, W.; Georgakos, G.; Schmitt-Landsiedell, D.
Proceedings of the 2005 International Conference on Microelectronic Test Structures, 2005. ICMTS 2005. Microelectronic Test Structures Microelectronic Test Structures, 2005. ICMTS 2005. Proceedings of the 2005 International Conference on. :43-46 2005
Conference
Proceedings of the 2005 International Conference on Microelectronic Test Structures, 2005. ICMTS 2005. Microelectronic Test Structures Microelectronic Test Structures, 2005. ICMTS 2005. Proceedings of the 2005 International Conference on. :155-158 2005
Conference
Nirschl, T.; Henzler, St.; Fischer, J.; Bargagli-Stoffi, A.; Fulde, M.; Sterkel, M.; Teichmann, P.; Schaper, U.; Einfeld, J.; Linnenbank, C.; Sedlmeir, J.; Weber, C.; Heinrich, R.; Ostermayr, N.; Olbrich, A.; Dobler, B.; Ruderer, E.; Kakoschke, R.; Schrufert, K.; Georgakos, G.; Hansch, W.; Schmitt-Landsiedel, D.
Proceedings of 35th European Solid-State Device Research Conference, 2005. ESSDERC 2005. Solid-State Device Research Conference Solid-State Device Research Conference, 2005. ESSDERC 2005. Proceedings of 35th European. :173-176 2005
Conference
Proceedings of the 2004 International Conference on Microelectronic Test Structures (IEEE Cat. No.04CH37516) Microelectronic test structures Microelectronic Test Structures, 2004. Proceedings. ICMTS '04. The International Conference on. :127-131 2004
Conference
Schaper, U.; Linnenbank, C.; Kollmer, U.; Mulatz, H.; Mensing, T.; Schmidt, R.; Tilgner, R.; Thewes, A.R.
ICMTS 2001. Proceedings of the 2001 International Conference on Microelectronic Test Structures (Cat. No.01CH37153) Microelectronic test structures Microelectronic Test Structures, 2001. ICMTS 2001. Proceedings of the 2001 International Conference on. :1-5 2001
Conference
ICMTS 2000. Proceedings of the 2000 International Conference on Microelectronic Test Structures (Cat. No.00CH37095) Microelectronic test structures Microelectronic Test Structures, 2000. ICMTS 2000. Proceedings of the 2000 International Conference on. :148-152 2000
검색 결과 제한하기
제한된 항목
[AR] Schaper, U.
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