학술논문
'학술논문'
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1~10
Academic Journal
Coquand, R.; Barraud, S.; Cassé, M.; Leroux, P.; Vizioz, C.; Comboroure, C.; Perreau, P.; Ernst, E.; Samson, M.-P.; Maffini-Alvaro, V.; Tabone, C.; Barnola, S.; Munteanu, D.; Ghibaudo, G.; Monfray, S.; Boeuf, F.; Poiroux, T.
In Solid State Electronics October 2013 88:32-36
Conference
Gaben, L.; Balan, V.; Euvrard, C.; Pauliac, S.; Dallery, J.-A.; Bustos, J.; Dechanoz, R.; Hemard, B.; Koscianski, L.; Bossy, X.; Arvet, C.; Vizioz, C.; Barnola, S.; Perrot, C.; Sturm, J.; Exbrayat, Y.; Loup, V.; Besson, P.; Perrin, B.; Previtali, B.; Samson, M.-P.; Barraud, S.; Monfray, S.; Boeuf, F.; Skotnicki, T.; Balestra, F.; Vinet, M.
2017 Joint International EUROSOI Workshop and International Conference on Ultimate Integration on Silicon (EUROSOI-ULIS) Ultimate Integration on Silicon (EUROSOI-ULIS), 2017 Joint International EUROSOI Workshop and International Conference on. :120-123 Apr, 2017
Conference
Gaben, L.; Barraud, S.; Samson, M.-P.; Hartmann, J.-M.; Vizioz, C.; Aussenac, F.; Allain, F.; Montray, S.; Boeuf, F.; Skotnicki, T.; Balestra, F.; Vinet, M.
EUROSOI-ULIS 2015: 2015 Joint International EUROSOI Workshop and International Conference on Ultimate Integration on Silicon Ultimate Integration on Silicon (EUROSOI-ULIS), 2015 Joint International EUROSOI Workshop and International Conference on. :13-16 Jan, 2015
Conference
Barraud, S.; Lavieville, R.; Tabone, C.; Allain, F.; Casse, M.; Samson, M.-P.; Maffini-Alvarro, V.; Vinet, M.
2014 15th International Conference on Ultimate Integration on Silicon (ULIS) Ultimate Integration on Silicon (ULIS), 2014 15th International Conference on. :65-68 Apr, 2014
Conference
Coquand, R.; Barraud, S.; Casse, M.; Koyama, M.; Maffini-Alvaro, V.; Samson, M.-P.; Tosti, L.; Mescot, X.; Ghibaudo, G.; Monfray, S.; Boeuf, F.; Faynot, O.; De Salvo, B.
2013 Proceedings of the European Solid-State Device Research Conference (ESSDERC) Solid-State Device Research Conference (ESSDERC), 2013 Proceedings of the European. :198-201 Sep, 2013
Conference
Coquand, R.; Barraud, S.; Casse, M.; Leroux, P.; Vizioz, C.; Comboroure, C.; Perreau, P.; Ernst, E.; Samson, M.-P.; Maffini-Alvaro, V.; Tabone, C.; Barnola, S.; Munteanu, D.; Ghibaudo, G.; Monfray, S.; Boeuf, F.; Poiroux, T.
2012 13th International Conference on Ultimate Integration on Silicon (ULIS) Ultimate Integration on Silicon (ULIS), 2012 13th International Conference on. :37-40 Mar, 2012
Conference
Lu, C.-M. V.; Deprat, F.; Fenouillet-Beranger, C.; Batude, P.; Garros, X.; Tsiara, A.; Leroux, C.; Gassilloud, R.; Nouguier, D.; Ney, D.; Federspiel, X.; Besombes, P.; Toffoli, A.; Romano, G.; Rambal, N.; Delaye, V.; Barge, D.; Samson, M.-P.; Previtali, B.; Tabone, C.; Pasini, L.; Brunet, L.; Andrieu, F.; Micoud, J.; Skotnicki, T.; Vinet, M.
2017 Symposium on VLSI Technology VLSI Technology, 2017 Symposium on. :T226-T227 Jun, 2017
Conference
Batude, P.; Brunet, L.; Fenouillet-Beranger, C.; Andrieu, F.; Colinge, J.-P.; Lattard, D.; Vianello, E.; Thuries, S.; Billoint, O.; Vivet, P.; Santos, C.; Mathieu, B.; Sklenard, B.; Lu, C.-M. V.; Micout, J.; Deprat, F.; Mercado, E. Avelar; Ponthenier, F.; Rambal, N.; Samson, M.-P.; Casse, M.; Hentz, S.; Arcamone, J.; Sicard, G.; Hutin, L.; Pasini, L.; Ayres, A.; Rozeau, O.; Berthelon, R.; Nemouchi, F.; Rodriguez, P.; Pin, J.-B.; Larmagnac, D.; Duboust, A.; Ripoche, V.; Barraud, S.; Allouti, N.; Barnola, S.; Vizioz, C.; Hartmann, J.-M.; Kerdiles, S.; Alba, P. Acosta; Beaurepaire, S.; Beugin, V.; Fournel, F.; Besson, P.; Loup, V.; Gassilloud, R.; Martin, F.; Garros, X.; Mazen, F.; Previtali, B.; Euvrard-Colnat, C.; Balan, V.; Comboroure, C.; Zussy, M.; Mazzocchi; Faynot, O.; Vinet, M.
2017 IEEE International Electron Devices Meeting (IEDM) Electron Devices Meeting (IEDM), 2017 IEEE International. :3.1.1-3.1.4 Dec, 2017
Conference
Micout, J.; Lapras, V.; Batude, P.; Fenouillet-Beranger, C.; Lacord, J.; Sklenard, B.; Mathieu, B.; Rafhay, Q.; Mazzocchi, V.; Colinge, J.-P.; Lachal, L.; Garros, X.; Casse, M.; Toffoli, A.; Romano, G.; Allain, F.; Brunet, L.; Hartmann, J.-M.; Bortolin, R.; Mazen, F.; Barraud, S.; Rambal, N.; Tabone, C.; Samson, M.-P.; Besombes, P.; Delaye, V.; Saghi, Z.; Loup, V.; Comboroure, C.; Balan, V.; Desvoivres, L.; Vizioz, C.; Ghibaudo, G.; Vinet, M.
2017 IEEE International Electron Devices Meeting (IEDM) Electron Devices Meeting (IEDM), 2017 IEEE International. :32.2.1-32.2.4 Dec, 2017
Conference
Monfray, S.; Chanemougame, D.; Borel, S.; Talbot, A.; Leverd, F.; Planes, N.; Delille, D.; Dutartre, D.; Palla, R.; Morand, Y.; Descombes, S.; Samson, M.-P.; Vulliet, N.; Sparks, T.; Vandooren, A.; Skotnicki, T.
IEDM Technical Digest. IEEE International Electron Devices Meeting, 2004. Electron devices meeting Electron Devices Meeting, 2004. IEDM Technical Digest. IEEE International. :635-638 2004
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[AR] Samson, M.-P.
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