학술논문
'학술논문'
에서 검색결과 4건 | 목록
1~10
Academic Journal
van Leeuwen, H.; Kujawa, S.; Dona, P.; Persoon, H.; Smit, C.; van den Boogaard, R.; Rodriguez, N.H.; Gramza, M.; Hoovinakatte, N.; van Lin, H.; Hoogeveen, J.; Bunton, J.; Lenz, D.; Manzke, R.; Shephard, J.; Bogers, M.; Ruinemans, E.; Franssen, R.; Cappa, S.
In: Microscopy and microanalysis : the official journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada . (Microscopy and microanalysis : the official journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada, 22 July 2023, 29(1):587-588)
Conference
Zaalberg, D.; Lewińska-Maresca, M.; Ruinemans, E.; Tromp, N.; Dolkens, D.; Agocs, T.; Lynn, J.; Lloro, I.; Schuil, M.; De Haan, M.; Ter Horst, R.; Elswijk, E.
In: Proceedings of SPIE - The International Society for Optical Engineering , Advances in Optical and Mechanical Technologies for Telescopes and Instrumentation V. (Proceedings of SPIE - The International Society for Optical Engineering, 2022, 12188)
Conference
Corpace, O.; Barriere, J.-C.; Bounad, A.; Cloue, O.; Guillard, J.-C.; Jury, S.; Lacroix, M.; Mendes, J.; Reinert, Y.; Dyrek, A.; Fontignie, J.; Lloro, I.; Lynn, J.; Raskin, G.; Ruinemans, E.; Tromp, N.
In: Proceedings of SPIE - The International Society for Optical Engineering , Advances in Optical and Mechanical Technologies for Telescopes and Instrumentation IV. (Proceedings of SPIE - The International Society for Optical Engineering, 2020, 11451)
Conference
Dhalluin, F.; De Winter, L.; Scaccabarozzi, L.; Brouns, D.; Arias Espinoza, J.D.; Péter, M.; Smith, D.; Van Der Zande, W.; Vermeulen, H.; Van Der Sanden, J.; Lentzen, S.; Van Gils, R.; Bogers, M.; Ruinemans, E.
In: Proceedings of SPIE - The International Society for Optical Engineering , Photomask Japan 2015: Photomask and Next-Generation Lithography Mask Technology XXII. (Proceedings of SPIE - The International Society for Optical Engineering, 2015, 9658)
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제한된 항목
[AR] Ruinemans, E.
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