학술논문
'학술논문'
에서 검색결과 342건 | 목록
1~10
Academic Journal
Zhao, X.; Ruchti, J.; Frisch, C.; Li, K.; Chen, Z.; Menzel, S.; Waser, R.; Schmidt, H.; Polian, I.; Pehl, M.; Du, N.
IEEE Transactions on Nanotechnology IEEE Trans. Nanotechnology Nanotechnology, IEEE Transactions on. 23:490-499 2024
Academic Journal
IEEE Transactions on Quantum Engineering IEEE Trans. Quantum Eng. Quantum Engineering, IEEE Transactions on. 5:1-10 2024
Academic Journal
In: Cryptography . (Cryptography, March 2024, 8(1))
Academic Journal
IEEE Transactions on Information Forensics and Security IEEE Trans.Inform.Forensic Secur. Information Forensics and Security, IEEE Transactions on. 18:463-476 2023
Academic Journal
Genssler, P.R.; Klemme, F.; Parihar, S.S.; Brandhofer, S.; Pahwa, G.; Polian, I.; Chauhan, Y.S.; Amrouch, H.
IEEE Transactions on Quantum Engineering IEEE Trans. Quantum Eng. Quantum Engineering, IEEE Transactions on. 4:1-11 2023
Conference
Amrouch, H.; Anders, J.; Becker, S.; Betka, M.; Bleher, G.; Domanski, P.; Elhamawy, N.; Ertl, T.; Gatzastras, A.; Genssler, P.; Hasler, S.; Heinrich, M.; van Hoorn, A.; Jafarzadeh, H.; Kallfass, I.; Klemme, F.; Koch, S.; Kusters, R.; Lalama, A.; Latty, R.; Liao, Y.; Lylina, N.; Haghi, Z. Najafi; Pfluger, D.; Polian, I.; Rivoir, J.; Sauer, M.; Schwachhofer, D.; Templin, S.; Volmer, C.; Wagner, S.; Weiskopf, D.; Wunderlich, H.-J.; Yang, B.; Zimmermann, M.
2022 Design, Automation & Test in Europe Conference & Exhibition (DATE) Design, Automation & Test in Europe Conference & Exhibition (DATE), 2022. :969-974 Mar, 2022
Conference
2021 IEEE 27th International Symposium on On-Line Testing and Robust System Design (IOLTS) On-Line Testing and Robust System Design (IOLTS), 2021 IEEE 27th International Symposium on. :1-7 Jun, 2021
Academic Journal
Chen, Z.; Du, N.; Kiani, M.; Zhao, X.; Skorupa, I.; Schulz, S.; Burger, D.; Ventra, M.D.; Polian, I.; Schmidt, H.
IEEE Transactions on Nanotechnology IEEE Trans. Nanotechnology Nanotechnology, IEEE Transactions on. 21:71-80 2022
Academic Journal
IEEE Design & Test IEEE Des. Test Design & Test, IEEE. 38(6):5-15 Dec, 2021
Academic Journal
In: Physical Review A . (Physical Review A, August 2023, 108(2))
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[AR] Polian, I.
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