학술논문
'학술논문'
에서 검색결과 185건 | 목록
1~10
Conference
2024 19th Conference on Ph.D Research in Microelectronics and Electronics (PRIME) Ph.D Research in Microelectronics and Electronics (PRIME), 2024 19th Conference on. :1-4 Jun, 2024
Academic Journal
Kovač, Mate; Dragić, Leon; Malnar, Branimir; Minervini, Francesco; Palomar, Oscar; Rojas, Carlos; Olivieri, Mauro; Knezović, Josip; Kovač, Mario
In Microprocessors and Microsystems March 2023 97
Conference
2023 18th Conference on Ph.D Research in Microelectronics and Electronics (PRIME) Ph.D Research in Microelectronics and Electronics (PRIME), 2023 18th Conference on. :169-172 Jun, 2023
Conference
Reggiani, Enrico; Pappalardo, Alessandro; Doblas, Max; Moreto, Miquel; Olivieri, Mauro; Unsal, Osman Sabri; Cristal, Adrian
2023 IEEE International Symposium on High-Performance Computer Architecture (HPCA) High-Performance Computer Architecture (HPCA), 2023 IEEE International Symposium on. :1085-1098 Feb, 2023
Academic Journal
Centurelli, Francesco; Fava, Alessandro; Olivieri, Mauro; Tommasino, Pasquale; Trifiletti, Alessandro
In AEUE - International Journal of Electronics and Communications July 2020 122
Conference
Barbirotta, Marcello; Cheikh, Abdallah; Mastrandrea, Antonio; Menichelli, Francesco; Olivieri, Mauro
2022 17th Conference on Ph.D Research in Microelectronics and Electronics (PRIME) Ph.D Research in Microelectronics and Electronics (PRIME), 2022 17th Conference on. :237-240 Jun, 2022
Conference
Barbirotta, Marcello; Cheikh, Abdallah; Mastrandrea, Antonio; Menichelli, Francesco; Vigli, Francesco; Olivieri, Mauro
2021 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT) Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT), 2021 IEEE International Symposium on. :1-4 Oct, 2021
Academic Journal
In Microelectronics Reliability December 2015 55(12) Part B:2614-2626
Conference
Barbirotta, Marcello; Mastrandrea, Antonio; Menichelli, Francesco; Vigli, Francesco; Blasi, Luigi; Cheikh, Abdallah; Sordillo, Stefano; Di Gennaro, Fabio; Olivieri, Mauro
2020 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT) Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT), 2020 IEEE International Symposium on. :1-6 Oct, 2020
Academic Journal
In Microelectronics Journal February 2014 45(2):179-195
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[AR] Olivieri, Mauro
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