학술논문
'학술논문'
에서 검색결과 8건 | 목록
1~10
Academic Journal
Kolberg, H.-C.; Niesing, H.; Akpolat-Basci, L.; Maguz, A.; Stephanou, M.; Kolberg-Liedtke, C.; Vaidya, J.S.; Hoffmann, O.; Loevey, G.
In: Anticancer Research . (Anticancer Research, February 2023, 43(2):733-739)
Conference
The 17th Annual SEMI/IEEE ASMC 2006 Conference Advanced Semiconductor Manufacturing Conference, 2006. ASMC 2006. The 17th Annual SEMI/IEEE. :114-119 2006
Book
(Elsevier Oceanography Series, 1997, 62(C):153-159)
Conference
Cekli, H.E.; Nije, J.; Ypma, A.; Bastani, V.; Sonntag, D.; Niesing, H.; Zhang, L.; Ullah, Z.; Subramony, V.; Somasundaram, R.; Susanto, W.; Matsunobu, M.; Johnson, J.; Tabery, C.; Lin, C.; Zou, Y.
In: Proceedings of SPIE - The International Society for Optical Engineering , Metrology, Inspection, and Process Control for Microlithography XXXII. (Proceedings of SPIE - The International Society for Optical Engineering, 2018, 10585)
Conference
Zhou, J.; Wu, S.; Hickman, C.; Van West, E.; Ulmer, D.; Van Der Schaar, M.; Park, S.; Affentauschegg, C.; Niesing, H.; Zhao, W.; Zhang, Y.; Tuffy, P.
In: Proceedings of SPIE - The International Society for Optical Engineering , Metrology, Inspection, and Process Control for Microlithography XXX. (Proceedings of SPIE - The International Society for Optical Engineering, 2016, 9778)
Conference
Charley, A.-L.; Leray, P.; Pypen, W.; Cheng, S.; Verma, A.; Mattheus, C.; Wisse, B.; Cramer, H.; Niesing, H.; Kruijswijk, S.
In: Proceedings of SPIE - The International Society for Optical Engineering , Metrology, Inspection, and Process Control for Microlithography XXVIII. (Proceedings of SPIE - The International Society for Optical Engineering, 2014, 9050)
Conference
Strobl, M.; Tsai, W.; Lan, A.; Chen, T.; Hsu, W.; Chen, H.; Liang, F.; Wang, A.; Hung, P.; Huang, D.; Chiu, E.; Yu, P.; Song, Y.; Yuan, S.; Dirks, R.; Wright, N.; Ponomarenko, M.; Cramer, H.; Wisse, B.; Couraudon, V.; Rajasekharan, B.; Plug, R.; Kruijswijk, S.; Niesing, H.
In: Proceedings of SPIE - The International Society for Optical Engineering , Metrology, Inspection, and Process Control for Microlithography XXVIII. (Proceedings of SPIE - The International Society for Optical Engineering, 2014, 9050)
Book
Peppink, G.; Kamphuis, R.; Kok, K.; Dimeas, A.; Karfopoulos, E.; Hatziargyriou, N.; Hadjsaid, N.; Caire, R.; Gustavsson, R.; Salas, J.M.; Niesing, H.; van der Velde, J.; Tena, L.; Bliek, F.; Eijgelaar, M.; Hamilton, L.; Akkermans, H.
In: Energy-Efficient Computing and Networking - First International Conference, E-Energy 2010, Revised Selected Papers . (Lecture Notes of the Institute for Computer Sciences, Social-Informatics and Telecommunications Engineering, LNICST, 2011, 54:215-224)
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제한된 항목
[AR] Niesing, H.
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