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Report
Casolino, M; Barghini, D; Battisti, M; Belov, A; Bertaina, M; Bisconti, F; Blaksley, C; Bolmgren, K; Cafagna, F; Cambiè, G; Capel, F; Ebisuzaki, T; Fenu, F; Franceschi, A; Fuglesang, C; Golzio, A; Gorodetzki, P; Kajino, F; Kasuga, H; Klimov, P; Kungel, V.; Manfrin, M; Marszał, W; Miyamoto, H; Mignone, M; Napolitano, T; Osteria, G; Parizot, E; Picozza, P; Piotrowski, L W; Plebaniak, Z; Prévôt, G; Reali, E; Ricci, M; Sakaki, N; Shinozaki, K; Takizawa, Y; Wada, S; Wiencke, L.
Electronic Resource
Bisconti, F; Barghini, D; Battisti, M; Belov, A; Bertaina, M E; Blin-Bondil, S; Cafagna, F; Cambiè, G; Capel, Francesca; Casolino, M; Cellino, A; Churilo, I; Cotto, G; Djakonow, A; Ebisuzaki, T; Fausti, F; Fenu, F; Fornaro, C; Franceschi, A; Fuglesang, Christer; Gardiol, D; Gorodetzky, P; Kajino, F; Klimov, P; Marcelli, L; Marszal, W; Mignone, M; Miyamoto, H; Murashov, A; Napolitano, T; Osteria, G; Panasyuk, M; Parizot, E; Poroshin, A; Picozza, P; Piotrowski, L W; Plebaniak, Z; Prévôt, G; Przybylak, M; Reali, E; Ricci, M; Sakaki, N; Shinozaki, K; Suino, G; Szabelski, J; Takizawa, Y; Traïche, M; Turriziani, S; Collaboration, J E M-E U S O
Electronic Resource
Miyamoto, H; Battisti, M; Belov, A; Bertaina, M E; Bisconti, F; Bonino, R; Blin-Bondil, S; Cafagna, F; Cambiè, G; Capel, Francesca; Casolino, M; Cellino, A; Churilo, I; Cotto, G; Djakonow, A; Ebisuzaki, T; Fausti, F; Fenu, F; Fornaro, C; Franceschi, A; Fuglesang, Christer; Gardiol, D; Gorodetzky, P; Kajino, F; Klimov, P; Marcelli, L; Marszal, W; Mignone, M; Murashov, A; Napolitano, T; Osteria, G; Panasyuk, M; Parizot, E; Poroshin, A; Picozza, P; Piotrowski, L W; Plebaniak, Z; Prévôt, G; Przybylak, M; Reali, E; Ricci, M; Sakaki, N; Shinozaki, K; Suino, G; Szabelski, J; Takizawa, Y; Traïche, M; Turriziani, S; Collaboration, J E M-E U S O
Electronic Resource
Casolino, M; Battisti, M; Belov, A; Bertaina, M; Bisconti, F; Blin-Bondil, S; Cafagna, F; Cambiè, G; Capel, Francesca; Churilo, I; Cotto, G; Djakonow, A; Ebisuzaki, T; Fausti, F; Fenu, F; Fornaro, C; Franceschi, A; Fuglesang, Christer; Gorodetzky, P; Haungs, A; Kajino, F; Klimov, P; Marcelli, L; Marszal, W; Mignone, M; Miyamoto, H; Murashov, A; Napolitano, T; Osteria, G; Panasyuk, M; Poroshin, A; Parizot, E; Picozza, P; Piotrowski, L W; Plebaniak, Z; Prévôt, G; Przybylak, M; Reali, E; Ricci, M; Sakaki, N; Shinozaki, K; Szabelski, J; Takizawa, Y; Traïche, M; Turriziani, S; Collaboration, J E M-E U S O
Academic Journal
Goerres, A; Bugalho, R; Francesco, A Di; Gastón, C; Gonçalves, F; Mazza, G; Mignone, M; Pietro, V Di; Riccardi, A; Ritman, J; Rivetti, A; Rolo, M D; Silva, J C da; Silva, R; Stockmanns, T; Varela, J; Veckalns, V; Wheadon, R
Journal of Instrumentation; Mar2014, Vol. 9 Issue 3, pC03025-C03025, 1p
Single-event upset tests on the readout electronics for the pixel detectors of the PANDA experiment.
Academic Journal
Mazza, G; Balossino, I; Calvo, D; Mori, F De; Remigis, P De; Filippi, A; Marcello, S; Mignone, M; Wheadon, R; Zotti, L; Candelori, A; Mattiazzo, S; Silvestrin, L
Journal of Instrumentation; Jan2014, Vol. 9 Issue 1, pC01042-C01042, 1p
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[AR] Mignone, M
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