학술논문
'학술논문'
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Mass Produced Micromachined Ultrasonic Time-Of-Flight Sensors Operating in Different Frequency Bands
Conference
Przybyla, Richard J.; Shelton, Stefon E.; Lee, Cathy; Eovino, Benjamin E.; Chau, Quy; Kline, Mitchell H.; Izyumin, Oleg I.; Horsley, David A.
2023 IEEE 36th International Conference on Micro Electro Mechanical Systems (MEMS) Micro Electro Mechanical Systems (MEMS), 2023 IEEE 36th International Conference on. :961-964 Jan, 2023
Academic Journal
Manning, Kenneth; Hall, Katherine; Sloane, Richard; Magistro, Daniele; Rabaglietti, Emanuela; Castle, Steven; Kopp, Teresa; Giffuni, Jamie; Katzel, Leslie; McDonald, Michelle; Miyamoto, Miles; Pearson, Megan; Jennings, Stephen; Bettger, Janet; Morey, Miriam; Lee, Cathy
Aging Cell. 23(1)
Conference
Shinohara, Keisuke; King, Casey; Regan, Dean; Regan, Eric; Carter, Andrew; Arias, Andrea; Bergman, Joshua; Urteaga, Miguel; Brar, Berinder; Cao, Yu; Xie, Andy; Beam, Edward; Lee, Cathy
2022 IEEE/MTT-S International Microwave Symposium - IMS 2022 International Microwave Symposium - IMS 2022, 2022 IEEE/MTT-S. :298-301 Jun, 2022
Academic Journal
Academic Journal
Academic Journal
Grill, Joshua D.; Di, Lijie; Lu, Po H.; Lee, Cathy; Ringman, John; Apostolova, Liana G.; Chow, Nicole; Kohannim, Omid; Cummings, Jeffrey L.; Thompson, Paul M.; Elashoff, David
In Neurobiology of Aging January 2013 34(1):62-72
Academic Journal
Kern, Robert S.; Gold, James M.; Dickinson, Dwight; Green, Michael F.; Nuechterlein, Keith H.; Baade, Lyle E.; Keefe, Richard S.E.; Mesholam-Gately, Raquelle I.; Seidman, Larry J.; Lee, Cathy; Sugar, Catherine A.; Marder, Stephen R.
In Schizophrenia Research 2011 126(1):124-131
Conference
2018 IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA) Physical and Failure Analysis of Integrated Circuits (IPFA), 2018 IEEE International Symposium on the. :1-4 Jul, 2018
Conference
Cui, Yongjie; Chen, Hung-Yu; Chen, Shuoqi; Linkhart, Douglas; Tan, Haosen; Wu, Jiangbin; Yoon, Soack; Geiler, Michael; Geiler, Anton; Beam, Edward; Xie, Andy; Wang, Nan; Regan, Michael; Kruzich, Mark; Nguyen, Bruce; White, Donald; Ketterson, Andrew; Lee, Cathy; Willis, David; Wang, Han; Cao, Yu
2021 IEEE International Electron Devices Meeting (IEDM) Electron Devices Meeting (IEDM), 2021 IEEE International. :4.2.1-4.2.4 Dec, 2021
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[AR] Lee, Cathy
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