학술논문
'학술논문'
에서 검색결과 78건 | 목록
1~10
Conference
Thuries, Sebastien; Billoint, Olivier; Choisnet, Sylvain; Lemaire, Romain; Vivet, Pascal; Batude, Perrine; Lattard, Didier
2020 Design, Automation & Test in Europe Conference & Exhibition (DATE). :1740-1745 Mar, 2020
Conference
2019 International 3D Systems Integration Conference (3DIC) 3D Systems Integration Conference (3DIC), 2019 International. :1-4 Oct, 2019
Conference
Vivet, Pascal; Guthmuller, Eric; Thonnart, Yvain; Pillonnet, Gael; Moritz, Guillaume; Miro-Panades, Ivan; Fuguet, Cesar; Durupt, Jean; Bernard, Christian; Varreau, Didier; Pontes, Julian; Thuries, Sebastien; Coriat, David; Harrand, Michel; Dutoit, Denis; Lattard, Didier; Arnaud, Lucile; Charbonnier, Jean; Coudrain, Perceval; Garnier, Arnaud; Berger, Frederic; Gueugnot, Alain; Greiner, Alain; Meunier, Quentin; Farcy, Alexis; Arriordaz, Alexandre; Cheramy, Severine; Clermidy, Fabien
2020 IEEE International Solid-State Circuits Conference - (ISSCC) Solid-State Circuits Conference - (ISSCC), 2020 IEEE International. :46-48 Feb, 2020
Conference
Jani, Imed; Lattard, Didier; Vivet, Pascal; Arnaud, Lucile; Cheramy, Severine; Beigne, Edith; Farcy, Alexis; Jourdon, Joris; Henrion, Yann; Deloffre, Emilie; Bilgen, Halim
2019 IEEE 69th Electronic Components and Technology Conference (ECTC) Electronic Components and Technology Conference (ECTC), 2019 IEEE 69th. :1926-1932 May, 2019
Conference
Vivet, Pascal; Sicard, Gilles; Millet, Laurent; Chevobbe, Stephane; Chehida, Karim Ben; Angel Cubero, Luis; Alegre, Monte; Bouvier, Maxence; Valentian, Alexandre; Lepecq, Maria; Dombek, Thomas; Bichler, Olivier; Thuries, Sebastien; Lattard, Didier; Severine, Cheramy; Batude, Perrine; Clermidy, Fabien
2019 Design, Automation & Test in Europe Conference & Exhibition (DATE) Design, Automation & Test in Europe Conference & Exhibition (DATE), 2019. :674-679 Mar, 2019
Conference
Vivet, Pascal; Thuries, Sebastien; Billoint, Olivier; Choisnet, Sylvain; Lattard, Didier; Beigne, Edith; Batude, Perrine
2018 25th IEEE International Conference on Electronics, Circuits and Systems (ICECS) Electronics, Circuits and Systems (ICECS), 2018 25th IEEE International Conference on. :157-160 Dec, 2018
Conference
2018 IEEE 23rd European Test Symposium (ETS) Test Symposium (ETS), 2018 IEEE 23rd European. :1-6 May, 2018
Innovative structures to test bonding alignment and characterize high density interconnects in 3D-IC
Conference
2017 15th IEEE International New Circuits and Systems Conference (NEWCAS) New Circuits and Systems Conference (NEWCAS), 2017 15th IEEE International. :153-156 Jun, 2017
Conference
2019 IEEE European Test Symposium (ETS) Test Symposium (ETS), 2019 IEEE European. :1-2 May, 2019
Conference
2015 IEEE 13th International New Circuits and Systems Conference (NEWCAS) New Circuits and Systems Conference (NEWCAS), 2015 IEEE 13th International. :1-4 Jun, 2015
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[AR] Lattard, Didier
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