학술논문
'학술논문'
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1~10
Academic Journal
Mostardinha, H.; Matos, D.; Carvalho, N.B.; Sampaio, J.; Pinto, M.; Gonçalves, P.; Sousa, T.; Kurpas, P.; Wuerfl, J.; Barnes, A.; Garat, F.; Poivey, C.
In: Scientific Reports . (Scientific Reports, December 2022, 12(1))
Academic Journal
In Microelectronics Reliability 2003 43(6):839-844
Conference
Mostardinha, H.; Cabral, P. M.; Carvalho, N. B.; Kurpas, P.; Rudolph, M.; Wurfl, J.; Pinto, J. C.; Barnes, A.; Garat, F.
2010 Workshop on Integrated Nonlinear Microwave and Millimeter-Wave Circuits Integrated Nonlinear Microwave and Millimeter-Wave Circuits (INMMIC), 2010 Workshop on. :50-53 Apr, 2010
Conference
European Gallium Arsenide and Other Semiconductor Application Symposium, GAAS 2005 Gallium Arsenide and other Compound Semiconductors Application Gallium Arsenide and Other Semiconductor Application Symposium, 2005. EGAAS 2005. European. :49-52 2005
Conference
Kurpas, P.; Maassdorf, A.; Neuner, M.; Heymann, P.; Janke, B.; Schnieder, F.; Bergunde, T.; Grasshoff, T.; Heinrich, W.; Wurfl, J.; Doser, W.; Blanck, H.; Auxemery, P.
IEDM Technical Digest. IEEE International Electron Devices Meeting, 2004. Electron devices meeting Electron Devices Meeting, 2004. IEDM Technical Digest. IEEE International. :561-564 2004
Conference
GaAs Reliability 2002 Workshop GaAs reliability GaAs Reliability Workshop, 2002. :161-166 2002
Conference
Kurpas, P.; Maassdorf, A.; Doser, W.; Heymann, P.; Janke, B.; Schnieder, F.; Blanck, H.; Auxemery, P.; Pons, D.; Heinrich, W.; Wurfl, J.
Digest. International Electron Devices Meeting, Electron devices meeting Electron Devices Meeting, 2002. IEDM '02. International. :681-684 2002
Conference
Kurpas, P.; Brunner, F.; Doemer, R.; Janke, B.; Heymann, P.; Maasdorf, A.; Doser, W.; Auxemery, P.; Blanck, H.; Pons, D.; Wurfl, J.; Heinrich, W.
2001 IEEE MTT-S International Microwave Sympsoium Digest (Cat. No.01CH37157) Microwave symposium Microwave Symposium Digest, 2001 IEEE MTT-S International. 2:633-636 vol.2 2001
Conference
2000 GaAs Reliability Workshop. Proceedings (IEEE Cat. No.00TH8513) GaAs reliability workshop GaAs Reliability Workshop, 2000. Proceedings. :205-224 2000
Conference
1997 Proceedings 47th Electronic Components and Technology Conference Electronic components and technology Electronic Components and Technology Conference, 1997. Proceedings., 47th. :1235-1241 1997
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[AR] Kurpas, P.
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