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Academic Journal
In: Electronics (Switzerland) . (Electronics (Switzerland), May 2023, 12(9))
Conference
2016 Design, Automation & Test in Europe Conference & Exhibition (DATE) Design, Automation & Test in Europe Conference & Exhibition (DATE), 2016. :73-78 Mar, 2016
Academic Journal
Beard, D.J.; Davies, L.; Cook, J.A.; Stokes, J.; Fletcher, H.; Abram, S.; Chegwin, K.; Greshon, A.; Shirkey, B.A.; Paez, A.; Carr, A.; Monk, P.; Morgado Areia, C.; Price, A.; Leal, J.; Lythe, V.; Mirza, B.; Jackson, W.; Bottomley, N.; Barker, K.; Lamb, S.E.; Dodd, M.; Bourke, H.; Phillips, M.; Brown, M.; O'Leary, S.; Haddad, F.; Wilson, C.; Emsley, R.; Peat, G.; Snow, M.; Campbell, M.; Howell, T.; Johnson, H.; McDonnell, S.; Pinkney, T.; Williams, M.; Campbell, H.; Davies, J.; Li, J.; Bagg, C.; Haywood, L.; Nicholson, A.; Riches, J.; Symons, S.; Vertue, M.; Al Mouazzen, L.; Bray, R.; Clark, D.; Coulthard, J.; Holland, T.; Howells, N.; Jones, A.; Kapur, R.; Kiszely, A.; Krishnan, H.; MacDonald-Taylor, K.; Manara, J.; Murray, J.; Negrut, C.; Pai, V.; Porteous, A.; Putnis, S.; Robinson, J.; Rupasinghe, S.; Selvaratnam, V.; Smith, J.; Smith, N.; Stevens, J.; Taylor, C.; Theodorides, A.; Vetharajan, N.; Vint, H.; Young, L.; Bullock, S.; Cook, R.; Dodds, A.; Freeman-Hicks, A.; Hillout, P.; Cornell, T.; Coutts, A.; Dean, S.; Devooght-Johnson, N.; Ferrell, E.; Fletcher, E.; Hall, C.; Kent, B.; Kessly, S.; Kincaid, R.; Lazizi, M.; Mostafa, A.; Nisbett, T.; Powell, T.; Riddlestone, P.; Roberton, A.; Summers, J.; Whitbread, L.; Wroath, B.; Fenlon, E.; Hall, A.; Jeffrey, H.; Thonse, R.; Dunne, D.; Metcalfe, A.; McGowan, K.; Middleton, S.; Shah, F.; Spalding, T.; Marie Suddens, C.; Sweed, T.; Teuke, J.; Thompson, P.; Wright, D.; Amero, J.; Brown, E.; Chissell, H.; Croucher, A.; Dickinson, G.; Hawkes-Blackburn, C.; Peacocke, A.; Smith, G.; Snipe, C.; Dearnley, K.; Mayahi, R.; Andrews, B.; Barcelona, M.; Giles, H.; Gokturk, A.; Harnett, P.; Jeeves, K.; Kadunyi, J.; Mendoza, S.; Reichert, I.; Santamaria, M.; Virdee, H.; Anand, S.; Aslam-Pervez, N.; Draycott, S.; Howarth, F.; Jina, I.; Maher, N.; Ross, D.; Worstenholme, L.; Baig, A.; Bhaskaran, A.; Banks, D.; Brear, T.; Christie, C.; Cowen, L.; Davis, J.; Dixey, R.; Esler, C.; Essop-Adam, A.; Haines, C.; Houchen-Wolloff, L.; Varachia, H.; Wood, R.; Gray, G.; Nichols, J.; Panes, A.; Partridge, S.; Rogerson, L.; Sharma, P.; Triggs, D.; Venables, I.; Wilcock, D.; Buckley, S.; Darian, T.; Denis, E.; Duncan, J.; Hirst, C.; Newman, J.; Richardson, F.; Smith, J.; Adcode, M.; Cottingham, M.; Foster, E.; Kelly, A.; McKay, N.; Rewbury, J.; Whitcher, A.; Williams, J.; Zebracki, E.; Davies, L.; Jayachandran, J.; Tardivel, A.; Whitehead, V.; Batting, M.; Bond, A.; Deakin, M.; Dodd, C.; Hudak, A.; Hynes, S.; Jones, L.; Lang, G.; McKenna, D.; Morris, S.; Scott-Dempster, C.; Sykes, A.; Vichos, I.; Wood, S.; Clifton, R.; Diaz, S.; Hendy, C.; Modi, N.; O'Mahony, B.; O'Sullivan, S.; Parker, N.; Pecheva, M.; Rumonovic, R.; McLoughlin, E.; Rushbrook, J.; Thornhill, A.; Parkinson, V.; Sales, R.; Van De Snepscheut-Jones, K.; Wilcock, D.; Wright, D.; Allison, J.; Baker, S.; Beesley, K.; Ferrari, G.; Lankester, B.; Lewis, A.; Lyons, J.; O'Callaghan, J.; Sutcliffe, S.; Wood, D.; Bannister, E.; Brown, C.; Burden, D.; Campbell, T.; Craig, E.; Easow, R.; Foxton, J.; Hazlerigg, A.; Jayabev, C.; Murdoch, R.; Parsons, G.; Brown, H.; Carvelli, P.; Montaser, R.; Pepper, A.; Sivarajan, S.; Templeton-Ward, O.; Wilson, E.; Cronin, J.; Diment, S.; King, V.; Shean, K.; Vachtsevanos, L.; Wilcocks, K.; Wilson, B.; McNestry, P.; Ollerenshaw, J.; Stoddard, J.; Sutton, P.; Anand, S.; Bell, J.; Chikate, A.; Daniel, D.; Davies, T.; Finnigan, T.; Frasquet-Garcia, A.; Hopkins, S.; Kerrison, S.; McGowan, A.; Sands Johnson, D.; Smith, L.; Turner, P.; Wilkinson, H.; Allsop, L.; Anthony, D.; Boulton, R.; Brown, S.; Desai, V.; Gill, M.; Heeley, C.; Kulkarni, S.; Lovegrove, W.; Nash, D.; Ann Sewell, T.; Shelton, S.; Slack, K.; Cartwright, J.; Connor, L.; Davies, A.; Davies, C.; Gainard, G.; Graham-Woollard, D.; Murphy, C.; Quinn, L.; Thomas, C.; Travers, J.; Williams, M.; Bell, A.; Deo, S.; Francis, K.; Jackson, T.; McCafferty, L.; Navadgi, B.; Plank, K.; Satish, V.; Thelwall, C.; Knight, R.; Patel, R.; Paton, B.; Acharya, A.; Aland, U.; Areirobulos, M.; de Feyter, P.; Ditchfield, L.; Iqbaz, H.; Massey, D.; Stables, G.; Appleby, S.; Brown, M.; Cable, S.; Damen, A.; Da Rocha, J.; Foster, L.; Hamilton, E.; Hatton, C.; Honeywell, C.; Kulkarni, K.; Markham, L.; Mohammed, H.; O'Grady, J.; Joshi, Y.; Mclintock, H.; Morgan, T.; Stockport, J.; Agrawal, P.; Armstrong, J.; Briggs, S.; Coupe, B.; Evans, A.; Gilbert, R.; Latham, S.; Mohammed, A.
In: The Lancet . (The Lancet, 20 August 2022, 400(10352):605-615)
Academic Journal
In: ACM Transactions on Embedded Computing Systems . (ACM Transactions on Embedded Computing Systems, February 2018, 17(3))
Academic Journal
In: ACM Transactions on Architecture and Code Optimization . (ACM Transactions on Architecture and Code Optimization, March 2017, 14(1))
Conference
In: Proceedings - IEEE Congress on Cybermatics: 2022 IEEE International Conferences on Internet of Things, iThings 2022, IEEE Green Computing and Communications, GreenCom 2022, IEEE Cyber, Physical and Social Computing, CPSCom 2022 and IEEE Smart Data, SmartData 2022 , Proceedings - IEEE Congress on Cybermatics: 2022 IEEE International Conferences on Internet of Things, iThings 2022, IEEE Green Computing and Communications, GreenCom 2022, IEEE Cyber, Physical and Social Computing, CPSCom 2022 and IEEE Smart Data, SmartData 2022. (Proceedings - IEEE Congress on Cybermatics: 2022 IEEE International Conferences on Internet of Things, iThings 2022, IEEE Green Computing and Communications, GreenCom 2022, IEEE Cyber, Physical and Social Computing, CPSCom 2022 and IEEE Smart Data, SmartData 2022, 2022, :107-112)
Academic Journal
Eder, K.; Georgiou, K.; Kerrison, S.; Morse, J.; Gallagher, J.P.; Kafle, B.; Kirkeby, M.; Li, X.; Rhiger, M.; Rosendahl, M.; López-García, P.; Banković, Z.; Haemmerlé, R.; Hermenegildo, M.V.; Klemen, M.; Liqat, U.; Muller, H.
In: Microprocessors and Microsystems . (Microprocessors and Microsystems, 1 November 2016, 47:278-286)
Book
Liqat, U.; Georgiou, K.; Kerrison, S.; Lopez-Garcia, P.; Gallagher, John P.; Hermenegildo, M. V.; Eder, K.
Foundational & Practical Aspects of Resource Analysis (9783319465586); 2016, p81-100, 20p
Academic Journal
In: ACM Transactions on Embedded Computing Systems . (ACM Transactions on Embedded Computing Systems, 1 April 2015, 14(3))
Academic Journal
In: Journal of the Royal Society of Medicine . (Journal of the Royal Society of Medicine, 1 August 2008, 101(8):416-422)
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[AR] Kerrison, S.
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