학술논문
'학술논문'
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Academic Journal
Bohula, E.A.; Berg, D.D.; Lopes, M.S.; Kuder, J.F.; Murphy, S.A.; O'Donoghue, M.L.; Park, J.-G.; Ruff, C.T.; Wiviott, S.D.; Baird-Zars, V.; Sabatine, M.S.; Morrow, D.A.; Connors, J.M.; Kim, E.Y.; Babar, I.; Barnett, C.F.; Chaudhry, S.-P.; Chopra, A.; Ginete, W.; Ieong, M.H.; Katz, J.N.; Mazza, E.; McLean, D.; Mosier, J.M.; Moskowitz, A.; Prasad, R.; Shahrour, M.N.; Sinha, S.S.; Van Diepen, S.; Zainea, M.; Im, K.A.; Saxena, R.; Wiley, B.; Benson, C.; Delamed, R.; Skeik, N.; Chopra, A.; Judson, M.; Beegle, S.; Shkolnik, B.; Tiwari, A.; Wu, G.; Raval, A.; Branch, E.; Rischard, F.; Hypes, C.; Bixby, B.; Bime, C.; Sundaram, M.; Sweitzer, N.; Sandoval, A.V.; White, H.; Berg, K.; Shaefi, S.; Donnino, M.; Carroll, B.; Ieong, M.; Ackerbauer, K.; Murphy, J.; Bhatt, A.; Blood, A.; Patel, S.; Luu, V.; Narechania, S.; Lorganger, A.; Plambeck, R.; Nayfeh, A.; Sanley, M.; Del Cor, M.; Hegg, A.J.; Nara, W.; Snyder, M.; Khan, F.; Shawa, I.; Larned, J.; Collado, E.; Al Faiyumi, M.; Mehta, R.; Komanapalli, S.; Muppidi, V.; Desai, M.; Flanagan, C.; Genovese, L.; Haddad, T.; King, C.; Peterson, A.; Htun, T.; Pionk, E.; Mouawad, N.; Kumar, C.; Nguyen, K.; Mughal, M.; Malek, R.; Parekh, A.; Provenzano, C.; Ianitelli, M.; Prentice-Gaytan, N.; Bykowski, A.; Tait, D.; Schendel, S.; Yalamanchili, V.; Lala, V.; Hunyadi, V.; Papolos, A.; Kenigsberg, B.; Shenoy, A.; Stuckey, T.; McQuaid, D.; Mannam, P.; McClung, J.; Nilsson, K.; McKown, A.; Wells, J.; Hotchkin, D.; Jacobs, M.; Strauss, W.; Balestra, R.; Sahni, V.; Snell, R.J.; Suradi, H.; Sungurlu, S.; Kuppy, J.; Gajo, E.; Adams, F.; Shehadeh, A.; Suleiman, A.; Nandigam, H.; Slim, J.; Babar, S.I.; Baral, D.; Nawaz, T.; Waheed, S.A.; Roth, R.; Sitaula, S.; Hayat, S.; Babu, J.; Caberto, J.; Hsu, V.; Chang, R.; Bochan, M.; Garcia-Cortes, R.; Skopicki, H.; Chen, O.; Pilato, L.; Richman, P.; Adler, A.; Sudhindra, P.; Beversdorf, J.; Kashyap, R.; Mehta, P.; Mehrad, B.; Ataya, A.; Lascano, J.; Brantly, M.; Austin, A.; Koman, E.; Galski, T.; Kumar, V.; Soubani, A.; Harrison, N.; Reddy, V.; Fonkam, A.
In: Circulation . (Circulation, 1 November 2022, 146(18):1344-1356)
Academic Journal
Garcia, M.A.; Gillmeyer, K.; Berical, A.; Ieong, M.; Rucci, J.M.; Walkey, A.J.; Bosch, N.A.; Hudspeth, J.; Modzelewski, K.L.; Schechter-Perkins, E.M.; Rampon, G.L.; Simpson, S.; Doros, G.; Ross, C.S.; Jia, S.; Jagan, N.
In: Annals of the American Thoracic Society . (Annals of the American Thoracic Society, September 2021, 18(9):1560-1566)
Conference
Topol, A.W.; La Tulipe, D.C.; Shi, L.; Alam, S.M.; Frank, D.J.; Steen, S.E.; Vichiconti, J.; Posillico, D.; Cobb, M.; Medd, S.; Patel, J.; Goma, S.; DiMilia, D.; Robson, M.T.; Duch, E.; Farinelli, M.; Wang, C.; Conti, R.A.; Canaperi, D.M.; Deligianni, L.; Kumar, A.; Kwietniak, K.T.; D'Emic, C.; Ott, J.; Young, A.M.; Guarini, K.W.; Ieong, M.
IEEE InternationalElectron Devices Meeting, 2005. IEDM Technical Digest. International Electron Devices Meeting 2005 Electron Devices Meeting, 2005. IEDM Technical Digest. IEEE International. :352-355 2005
Conference
Singh, D.V.; Sleight, J.W.; Hergenrother, J.M.; Ren, Z.; Jenkins, K.A.; Dokumaci, O.; Black, L.; Chang, J.B.; Nakayama, H.; Chidambarrao, D.; Venigalla, R.; Pan, J.; Natzle, W.; Tessier, B.L.; Nomura, A.; Ott, J.A.; Ieong, M.; Haensch, W.
IEEE InternationalElectron Devices Meeting, 2005. IEDM Technical Digest. International Electron Devices Meeting 2005 Electron Devices Meeting, 2005. IEDM Technical Digest. IEEE International. :505-508 2005
Conference
Ren, Z.; Ieong, M.; Cai, J.; Holt, J.; Boyd, D.; Mo, R.; Yin, H.; Dokumaci, O.; Kawanaka, S.; Sato, T.; Ronsheim, P.; Wang, J.; Sung, C.Y.; Haensch, W.
IEEE InternationalElectron Devices Meeting, 2005. IEDM Technical Digest. International Electron Devices Meeting 2005 Electron Devices Meeting, 2005. IEDM Technical Digest. IEEE International. :733-736 2005
Conference
Proceedings. 7th International Conference on Solid-State and Integrated Circuits Technology, 2004. Solid-state and integrated circuits technology Solid-State and Integrated Circuits Technology, 2004. Proceedings. 7th International Conference on. 1:306-309 vol.1 2004
Conference
Gusev, E.P.; Cabral, C., Jr.; Under, B.P.; Kim, Y.H.; Maitra, K.; Carrier, E.; Nayfeh, H.; Amos, R.; Biery, G.; Bojarczuk, N.; Callegari, A.; Carruthers, R.; Cohen, S.A.; Copel, M.; Fang, S.; Frank, M.; Guha, S.; Gribelyuk, M.; Jamison, P.; Jammy, R.; Ieong, M.; Kedzierski, J.; Kozlowski, P.; Ku, K.; Lacey, D.; LaTulipe, D.; Narayanan, V.; Ng, H.; Nguyen, P.; Newbury, J.; Paruchuri, V.; Rengarajan, R.; Shahidi, G.; Steegen, A.; Steen, M.; Zafar, S.; Zhang, Y.
IEDM Technical Digest. IEEE International Electron Devices Meeting, 2004. Electron devices meeting Electron Devices Meeting, 2004. IEDM Technical Digest. IEEE International. :79-82 2004
Conference
Fried, D.M.; Hergenrother, J.M.; Topol, A.W.; Chang, L.; Sekaric, L.; Sleight, J.W.; McNab, S.J.; Newbury, J.; Steen, S.E.; Gibson, G.; Zhang, Y.; Fuller, N.C.M.; Bucchignano, J.; Lavoie, C.; Cabral Jr, C.; Canaperi, D.; Dokumaci, O.; Frank, D.J.; Duch, E.A.; Babich, I.; Wong, K.; Ott, J.A.; Adams, C.D.; Dalton, T.J.; Nunes, R.; Medeiros, D.R.; Viswanathan, R.; Ketchen, M.; Ieong, M.; Haensch, W.; Guarini, K.W.
IEDM Technical Digest. IEEE International Electron Devices Meeting, 2004. Electron devices meeting Electron Devices Meeting, 2004. IEDM Technical Digest. IEEE International. :261-264 2004
Conference
Wong, H.-S.P.; Doris, B.; Gusev, E.; Ieong, M.; Jones, E.C.; Kedzierski, J.; Ren, Z.; Rim, K.; Shang, H.
2003 International Symposium on VLSI Technology, Systems and Applications. Proceedings of Technical Papers. (IEEE Cat. No.03TH8672) VLSI technology, systems and applications VLSI Technology, Systems, and Applications, 2003 International Symposium on. :13-16 2003
Conference
International Conference on Simulation of Semiconductor Processes and Devices Simulation of semiconductor processes Simulation of Semiconductor Processes and Devices, 2002. SISPAD 2002. International Conference on. :225-230 2002
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[AR] Ieong, M.
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