학술논문
'학술논문'
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1~10
Conference
Vidal-Dho, Matthias; Hubert, Quentin; Gonon, Patrice; Pelissier, Bernard; Lentrein, Philippe; Ray, Patrice; Moragues, Jean-Michel; Fornara, Pascal
2020 IEEE 33rd International Conference on Microelectronic Test Structures (ICMTS) Microelectronic Test Structures (ICMTS), 2020 IEEE 33rd International Conference on. :1-4 May, 2020
Moisture Influence on Reliability and Electrical Characteristics of SiOC:H Low-k Dielectric Material
Conference
Vidal-Dho, Matthias; Hubert, Quentin; Gonon, Patrice; Pelissier, Bernard; Fornara, Pascal; Escales, Jean-Philippe; Potard, Pascale; Moragues, Jean-Michel; Ogier, Jean-Luc
2019 IEEE International Integrated Reliability Workshop (IIRW) Integrated Reliability Workshop (IIRW), 2019 IEEE International. :1-4 Oct, 2019
Conference
Vidal-Dho, Matthias; Hubert, Quentin; Gonon, Patrice; Delorme, Philippe; Jacquot, Jonathan; Marchetti, Maxime; Beauvisage, Ludovic; Moragues, Jean-Michel; Potard, Pascale; Fornara, Pascal; Escales, Jean-Philippe; Sallagoity, Pascal; Pizzuto, Olivier; Maury, Delphine; Mirabel, Jean-Michel
2019 IEEE 32nd International Conference on Microelectronic Test Structures (ICMTS) Microelectronic Test Structures (ICMTS), 2019 IEEE 32nd International Conference on. :176-179 Mar, 2019
Academic Journal
Hubert, Quentin; Jahan, Carine; Toffoli, Alain; Delaye, Vincent; Lafond, Dominique; Grampeix, Helen; de Salvo, Barbara
Academic Journal
Betti Beneventi, Giovanni; Perniola, Luca; Hubert, Quentin; Gliere, Alain; Larcher, Luca; Pavan, Paolo; De Salvo, Barbara
Academic Journal
Beneventi, Giovanni Betti; Perniola, Luca; Hubert, Quentin; Gliere, Alain; Larcher, Luca; Pavan, Paolo; De Salvo, Barbara
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[AR] Hubert, Quentin
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