학술논문
'학술논문'
에서 검색결과 77건 | 목록
1~10
Academic Journal
Pantouvaki, M.; Humbert, A.; VanBesien, E.; Camerotto, E.; Travaly, Y.; Richard, O.; Willegems, M.; Volders, H.; Kellens, K.; Daamen, R.; Hoofman, R.J.O.M.; Beyer, G.
In Microelectronic Engineering 2008 85(10):2071-2074
Academic Journal
In Microelectronic Engineering 2007 84(9):2177-2183
Academic Journal
Hoofman, R.J.O.M.; Caluwaerts, R.; Michelon, J.; Herrero Bernabé, P.; Gueneau de Mussy, J.P.; Bruynseraede, C.; Lee, J.M.; List, S.; Bancken, P.H.L.; Beyer, G.
In Microelectronic Engineering 2006 83(11):2150-2154
Academic Journal
Hoofman, R.J.O.M.; Verheijden, G.J.A.M.; Michelon, J.; Iacopi, F.; Travaly, Y.; Baklanov, M.R.; Tökei, Zs.; Beyer, G.P.
In Microelectronic Engineering 17 June 2005 80:337-344
Academic Journal
Gosset, L.G.; Farcy, A.; de Pontcharra, J.; Lyan, Ph.; Daamen, R.; Verheijden, G.J.A.M.; Arnal, V.; Gaillard, F.; Bouchu, D.; Bancken, P.H.L.; Vandeweyer, T.; Michelon, J.; Hoang, V. Nguyen; Hoofman, R.J.O.M.; Torres, J.
In Microelectronic Engineering 2005 82(3):321-332
Academic Journal
Gonda, V.; Den Toonder, J.M.J.; Beijer, J.; Zhang, G.Q.; van Driel, W.D.; Hoofman, R.J.O.M.; Ernst, L.J.
In Microelectronics Reliability 2004 44(12):2011-2017
Conference
Arnal, V.; Hoofman, R.J.O.M.; Assous, M.; Bancken, P.H.L.; Brokaart, M.; Brun, P.; Casanova, N.; Chapelon, L.L.; Chevolleau, T.; Cowache, C.; Daamen, R.; Farcy, A.; Fayolle, M.; Feldis, H.; Furukawa, Y.; Goldberg, C.; Gosset, L.G.; Guedj, C.; Haxaire, K.; Hinsinger, O.; Josse, E.; Jullian, S.; Louveau, O.; Michelon, J.; Posseme, N.; Rivoire, M.; Roman, A.; Vandeweyer, T.; Verheijden, J.A.M.; Torres, J.
Proceedings of the IEEE 2004 International Interconnect Technology Conference (IEEE Cat. No.04TH8729) Interconnect technology Interconnect Technology Conference, 2004. Proceedings of the IEEE 2004 International. :202-240 2004
Conference
Tokei, Z.; Sutcliffe, V.; Demuynck, S.; Iacopi, F.; Roussel, P.; Beyer, G.P.; Hoofman, R.J.O.M.; Maex, K.
2004 IEEE International Reliability Physics Symposium. Proceedings Reliability physics Reliability Physics Symposium Proceedings, 2004. 42nd Annual. 2004 IEEE International. :326-332 2004
Conference
Ikeda, A.; Travaly, Y.; Humbert, A.; Hoofman, R.J.O.M.; Li, Y.L.; Tokei, Zs.; Iacopi, F.; Michelon, J.; Bruynseraede, C.; Willegems, M.; Hendrickx, D.; Van Aelst, J.; Struyf, H.; Versluijs, J.; Heylen, N.; Carbonell, L.; Richard, O.; Bender, H.; Kaiser, M.; Weemaes, R.G.R.; Verheyden, G.; Kemeling, N.; Fukazawa, A.; Matsuki, N.; Sprey, H.; Ciofi, I.; Beyer, G.; Van Hove, M.
2006 International Interconnect Technology Conference Interconnect Technology Conference, 2006 International. :42-44 2006
Conference
Hoofman, R.J.O.M.; Michelon, J.; Bancken, P.H.L.; Daamen, R.; Verheijden, G.J.A.M.; Arnal, V.; Hinsinger, O.; Gosset, L.G.; Humbert, A.; Besling, W.F.A.; Goldberg, C.; Fox, R.; Michaelson, L.; Guedj, C.; Guillaumond, J.F.; Jousseaume, V.; Arnaud, L.; Gravesteijn, D.J.; Torres, J.; Passemard, G.
Proceedings of the IEEE 2005 International Interconnect Technology Conference, 2005. Interconnect technology Interconnect Technology Conference, 2005. Proceedings of the IEEE 2005 International. :85-87 2005
검색 결과 제한하기
제한된 항목
[AR] Hoofman, R.J.O.M.
발행연도 제한
-
학술DB(Database Provider)
저널명(출판물, Title)
출판사(Publisher)
자료유형(Source Type)
주제어
언어