학술논문
'학술논문'
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1~10
Academic Journal
Clerix, J.J.; Warad, L.; Hung, J.; Hody, H.; Van Roey, F.; Lorusso, G.; Koret, R.; Lee, W.T.; Shah, K.; Delabie, A.
In Applied Surface Science 30 July 2023 626
Academic Journal
Thesberg, M.; Stanojevic, Z.; Baumgartner, O.; Kernstock, C.; Leonelli, D.; Barci, M.; Wang, X.; Zhou, X.; Jiao, H.; Donadio, G.L.; Garbin, D.; Witters, T.; Kundu, S.; Hody, H.; Delhougne, R.; Kar, G.; Karner, M.
In Solid State Electronics January 2023 199
Conference
Van Beek, S.; Cai, K.; Yasin, F.; Hody, H.; Talmelli, G.; Nguyen, V.D.; Vergel, N. Franchina; Palomino, A.; Trovato, A.; Wostyn, K.; Rao, S.; Kar, G.S.; Couet, S.
2023 International Electron Devices Meeting (IEDM) Electron Devices Meeting (IEDM), 2023 International. :1-4 Dec, 2023
Academic Journal
Ravsher, T.; Garbin, D.; Fantini, A.; Degraeve, R.; Clima, S.; Donadio, G.L.; Kundu, S.; Hody, H.; Devulder, W.; Van Houdt, J.; Afanas'ev, V.; Delhougne, R.; Kar, G.S.
IEEE Transactions on Electron Devices IEEE Trans. Electron Devices Electron Devices, IEEE Transactions on. 70(5):2276-2281 May, 2023
Report
Thesberg, M.; Stanojevic, Z.; Baumgartner, O.; Kernstock, C.; Leonelli, D.; Barci, M.; Wang, X.; Zhou, X.; Jiao, H.; Donadio, G. L.; Garbin, D.; Witters, T.; Kundu, S.; Hody, H.; Delhougne, R.; Kar, G.; Karner, M.
Solid-State Electronics, Volume 199, January 2023, 108504
Threshold switching in a-Si and a-Ge based MSM selectors and its implications for device reliability
Conference
Ravsher, T.; Sharifi, S. H.; Fantini, A.; Hody, H.; Witters, T.; Garbin, D.; Degraeve, R.; Afanas'ev, V.; van Houdt, J.; Goux, L.; Crotti, D.; Kar, G.
2021 IEEE International Memory Workshop (IMW) Memory Workshop (IMW), 2021 IEEE International. :1-4 May, 2021
Conference
Subhechha, S.; Rassoul, N.; Belmonte, A.; Hody, H.; Dekkers, H.; van Setten, M. J.; Chasin, A.; Sharifi, S.H.; Sutar, S.; Magnarin, L.; Celano, U.; Puliyalil, H.; Kundu, S.; Pak, M.; Teugels, L.; Tsvetanova, D.; Bazzazian, N.; Vandersmissen, K.; Biasotto, C.; Batuk, D.; Geypen, J.; Heijlen, J.; Delhougne, R.; Kar, G. S.
2022 IEEE Symposium on VLSI Technology and Circuits (VLSI Technology and Circuits) VLSI Technology and Circuits (VLSI Technology and Circuits), 2022 IEEE Symposium on. :292-293 Jun, 2022
Academic Journal
Ravsher, T.; Van Houdt, J.; Afanas'ev, V.; Garbin, D.; Fantini, A.; Degraeve, R.; Clima, S.; Donadio, G.L.; Kundu, S.; Hody, H.; Devulder, W.; Delhougne, R.; Kar, G.S.
In: Physica Status Solidi - Rapid Research Letters . (Physica Status Solidi - Rapid Research Letters, August 2023, 17(8))
Device engineering guidelines for performance boost in IGZO front gated TFTs based on defect control
Conference
Subhechha, S.; Rassoul, N.; Belmonte, A.; Hody, H.; Dekkers, H.; van Setten, M. J.; Chasin, A.; Sharifi, S.H.; Banerjee, K.; Puliyalil, H.; Kundu, S.; Pak, M.; Tsvetanova, D.; Bazzazian, N.; Vandersmissen, K.; Batuk, D.; Geypen, J.; Heijlen, J.; Delhougne, R.; Kar, G. S.
2022 International Conference on IC Design and Technology (ICICDT) IC Design and Technology (ICICDT), 2022 International Conference on. :88-88 Sep, 2022
Academic Journal
De Proft, A.; Garbin, D.; Donadio, G.L.; Hody, H.; Witters, T.; Lodewijks, K.; Rottenberg, X.; Goux, L.; Delhougne, R.; Kar, G.S.
IEEE Transactions on Electron Devices IEEE Trans. Electron Devices Electron Devices, IEEE Transactions on. 67(10):4228-4233 Oct, 2020
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[AR] Hody, H.
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