학술논문
'학술논문'
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1~10
Conference
Bao, R.; Qin, L.; Frougier, J.; Suk, S.; Rabie, M.; Bajpai, U.; Chou, A.; Nechay, B.; Mohamed, M.; Pujari, R.; Weir, T. J; Harmon, K.; Varma, A.; Armstrong-Moore, W.; Cestero, A.; Emans, S.; Hundekar, P.; Joshi, R.; Li, J.; Liu, X.; Lucarini, S.; Radens, C.; Siddiqui, S.; Trombley, H.; Bryant, A.; Hasanuzzaman, M.; Majumdar, A.; Sung, M.; Zhang, J.; Leobandung, E.
2023 International Electron Devices Meeting (IEDM) Electron Devices Meeting (IEDM), 2023 International. :1-4 Dec, 2023
Conference
Seshadri, I.; Miller, E.; Church, J.; Chu, A.; Zhang, J.; Greene, A.; Frougier, J.; Li, T.; Cabrera, Y.; Kenath, G.; Burkhardt, M.; Skordas, S.; Meli, L.; Felix, N.
2023 International Electron Devices Meeting (IEDM) Electron Devices Meeting (IEDM), 2023 International. :1-4 Dec, 2023
Academic Journal
Schmidt, D.; Cepler, A.; Durfee, C.; Pancharatnam, S.; Frougier, J.; Breton, M.; Greene, A.; Klare, M.; Koret, R.; Turovets, I.
IEEE Transactions on Semiconductor Manufacturing IEEE Trans. Semicond. Manufact. Semiconductor Manufacturing, IEEE Transactions on. 35(3):412-417 Aug, 2022
Academic Journal
Schmidt, D.; Medikonda, M.; Rizzolo, M.; Silvestre, C.; Frougier, J.; Greene, A.; Breton, M.; Cepler, A.; Ofek, J.; Kaplan, I.; Koret, R.; Turovets, I.
In: Journal of Micro/Nanopatterning, Materials and Metrology . (Journal of Micro/Nanopatterning, Materials and Metrology, 1 July 2023, 22(3))
Academic Journal
Cheng, K.; Park, C.; Wu, H.; Li, J.; Nguyen, S.; Zhang, J.; Wang, M.; Mehta, S.; Liu, Z.; Conti, R.; Loubet, N.J.; Frougier, J.; Greene, A.; Yamashita, T.; Haran, B.; Divakaruni, R.
IEEE Transactions on Electron Devices IEEE Trans. Electron Devices Electron Devices, IEEE Transactions on. 67(12):5355-5361 Dec, 2020
Report
Barate, P.; Liang, S.; Zhang, T. T.; Frougier, J.; Vidal, M.; Renucci, P.; Devaux, X.; Xu, B.; Jaffrès, H.; George, J. M.; Marie, X.; Hehn, M.; Mangin, S.; Zheng, Y.; Amand, T.; Tao, B.; Han, X. F.; Wang, Z.; Lu, Y.
Applied Physics Letters, 105, 012404 (2014)
Conference
Zhang, J.; Frougier, J.; Greene, A.; Miao, X.; Yu, L.; Vega, R.; Montanini, P.; Durfee, C.; Gaul, A.; Pancharatnam, S.; Adams, C.; Wu, H.; Zhou, H.; Shen, T.; Xie, R.; Sankarapandian, M.; Wang, J.; Watanabe, K.; Bao, R.; Liu, X.; Park, C.; Shobha, H.; Joseph, P.; Kong, D.; De La Pena, A. Arceo; Li, J.; Conti, R.; Dechene, D.; Loubet, N.; Chao, R.; Yamashita, T.; Robison, R.; Basker, V.; Zhao, K.; Guo, D.; Haran, B.; Divakaruni, R.; Bu, H.
2019 IEEE International Electron Devices Meeting (IEDM) Electron Devices Meeting (IEDM), 2019 IEEE International. :11.6.1-11.6.4 Dec, 2019
Conference
Loubet, N.; Kal, S.; Alix, C.; Pancharatnam, S.; Zhou, H.; Durfee, C.; Belyansky, M.; Haller, N.; Watanabe, K.; Devarajan, T.; Zhang, J.; Miao, X.; Sankar, M.; Breton, M.; Chao, R.; Greene, A.; Yu, L.; Frougier, J.; Chanemougame, D.; Tapily, K.; Smith, J.; Basker, V.; Mosden, A.; Biolsi, P.; Hurd, T. Q.; Divakaruni, R.; Haran, B.; Bu, H.
2019 IEEE International Electron Devices Meeting (IEDM) Electron Devices Meeting (IEDM), 2019 IEEE International. :11.4.1-11.4.4 Dec, 2019
Academic Journal
In: Journal of Micro/Nanopatterning, Materials and Metrology . (Journal of Micro/Nanopatterning, Materials and Metrology, 1 April 2022, 21(2))
Conference
Chouaib, H.; Cangiano, A.; Cross, A.; Shaughnessy, D.; Tan, Z.; Dimastrodonato, V.; Chou, A.; Schmidt, D.; Durfee, C.; Pancharatnam, S.; Frougier, J.; Greene, A.; Breton, M.
In: Proceedings of SPIE - The International Society for Optical Engineering , Metrology, Inspection, and Process Control XXXVIII. (Proceedings of SPIE - The International Society for Optical Engineering, 2024, 12955)
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[AR] Frougier, J.
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