학술논문
'학술논문'
에서 검색결과 7건 | 목록
1~10
Conference
Anders, Jens; Andreu, Pablo; Becker, Bernd; Becker, Steffen; Cantoro, Riccardo; Deligiannis, Nikolaos I.; Elhamawy, Nourhan; Faller, Tobias; Hernandez, Carles; Mentens, Nele; Rizi, Mahnaz Namazi; Polian, Ilia; Sajadi, Abolfazl; Sauer, Mathias; Schwachhofer, Denis; Reorda, Matteo Sonza; Stefanov, Todor; Tuzov, Ilya; Wagner, Stefan; Zidaric, Nusa
2023 IEEE European Test Symposium (ETS) European Test Symposium (ETS), 2023 IEEE. :1-10 May, 2023
Conference
2023 IEEE European Test Symposium (ETS) European Test Symposium (ETS), 2023 IEEE. :1-6 May, 2023
Conference
Deligiannis, Nikolaos I.; Faller, Tobias; Chenghan, Zhou; Cantoro, Riccardo; Becker, Bernd; Reorda, Matteo Sonza
2023 IEEE European Test Symposium (ETS) European Test Symposium (ETS), 2023 IEEE. :1-5 May, 2023
Conference
Deligiannis, Nikolaos I.; Faller, Tobias; Rodriguez Condia, Josie E.; Cantoro, Riccardo; Becker, Bernd; Reorda, Matteo Sonza
2022 IEEE 31st Asian Test Symposium (ATS) ATS Test Symposium (ATS), 2022 IEEE 31st Asian. :84-89 Nov, 2022
Conference
Deligiannis, Nikolaos I.; Cantoro, Riccardo; Faller, Tobias; Paxian, Tobias; Becker, Bernd; Reorda, Matteo Sonza
2021 IEEE 30th Asian Test Symposium (ATS) ATS Asian Test Symposium (ATS), 2021 IEEE 30th. :73-78 Nov, 2021
Periodical
Deligiannis, Nikolaos Ioannis; Faller, Tobias; Cantoro, Riccardo; Paxian, Tobias; Becker, Bernd; Reorda, Matteo Sonza
IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems; November 2023, Vol. 42 Issue: 11 p4270-4281, 12p
Conference
2021 IEEE 22nd Latin American Test Symposium (LATS) Latin American Test Symposium (LATS), 2021 IEEE 22nd. :1-2 Oct, 2021
검색 결과 제한하기
제한된 항목
[AR] Faller, Tobias
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