학술논문
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Conference
Vellianitis, G.; Van Dal, M.J.H.; Witters, L.; Curatola, G.; Doornbos, G.; Collaert, N.; Jonville, C.; Torregiani, C.; Lai, L.-S.; Petry, J.; Pawlak, B.J.; Duffy, R.; Demand, M.; Beckx, S.; Mertens, S.; Delabie, A.; Vandeweyer, T.; Delvaux, C.; Leys, F.; Hikavyy, A.; Rooyackers, R.; Kaiser, M.; Weemaes, R.G.R.; Voogt, F.; Roberts, H.; Donnet, D.; Biesemans, S.; Jurczak, M.; Lander, R.J.P.
2007 IEEE International Electron Devices Meeting Electron Devices Meeting, 2007. IEDM 2007. IEEE International. :681-684 Dec, 2007
Conference
In: Conference Proceedings from the International Symposium for Testing and Failure Analysis , ISTFA 2023: Proceedings of the 49th International Symposium for Testing and Failure Analysis Conference. (Conference Proceedings from the International Symposium for Testing and Failure Analysis, 2023, 2023-November:300-304)
Academic Journal
In: Revue Francaise de Psychanalyse . (Revue Francaise de Psychanalyse, 2014, 78(2):478-487)
Conference
Haimson, O.; Goldman, R.; Wong, M.; Sidorov, O.; Donnet, D.; Tien, D.; Ahlgren, D.; Leslie, N.; Jensen, J.
In: Proceedings of the International Symposium on the Physical and Failure Analysis of Integrated Circuits, IPFA , 2020 IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits, IPFA 2020. (Proceedings of the International Symposium on the Physical and Failure Analysis of Integrated Circuits, IPFA, 20 July 2020, 2020-July)
Conference
In: Conference Proceedings from the International Symposium for Testing and Failure Analysis , ISTFA 2020 - Papers Accecpted for the Planned 46th International Symposium for Testing and Failure Analysis. (Conference Proceedings from the International Symposium for Testing and Failure Analysis, 2020, 2020-November:305-310)
Conference
2010 IEEE International Reliability Physics Symposium (IRPS); 2010, p724-730, 7p
Academic Journal
In: Revue Belge de Philologie et de Histoire . (Revue Belge de Philologie et de Histoire, 2003, 81(1):161-187)
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[AR] Donnet, D.
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