학술논문
'학술논문'
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1~10
Academic Journal
Coquand, R.; Barraud, S.; Cassé, M.; Leroux, P.; Vizioz, C.; Comboroure, C.; Perreau, P.; Ernst, E.; Samson, M.-P.; Maffini-Alvaro, V.; Tabone, C.; Barnola, S.; Munteanu, D.; Ghibaudo, G.; Monfray, S.; Boeuf, F.; Poiroux, T.
In Solid State Electronics October 2013 88:32-36
Academic Journal
Deshpande, V.; Barraud, S.; Jehl, X.; Wacquez, R.; Vinet, M.; Coquand, R.; Roche, B.; Voisin, B.; Triozon, F.; Vizioz, C.; Tosti, L.; Previtali, B.; Perreau, P.; Poiroux, T.; Sanquer, M.; Faynot, O.
In Solid State Electronics June 2013 84:179-184
Academic Journal
Koyama, M.; Cassé, M.; Coquand, R.; Barraud, S.; Vizioz, C.; Comboroure, C.; Perreau, P.; Maffini-Alvaro, V.; Tabone, C.; Tosti, L.; Barnola, S.; Delaye, V.; Aussenac, F.; Ghibaudo, G.; Iwai, H.; Reimbold, G.
In Solid State Electronics June 2013 84:46-52
Academic Journal
In Solid State Electronics August 2012 74:25-31
Conference
Piccolboni, G.; Parise, M.; Molas, G.; Levisse, A.; Portal, J. M.; Coquand, R.; Carabasse, C.; Bernard, M.; Roule, A.; Noel, J. P.; Giraud, B.; Harrand, M.; Cagli, C.; Magis, T.; Vianello, E.; De Salvo, B.; Ghibaudo, G.; Perniola, L.
2016 IEEE 8th International Memory Workshop (IMW) Memory Workshop (IMW), 2016 IEEE 8th International. :1-4 May, 2016
Conference
Reboh, S.; Coquand, R.; Loubet, N.; Bernier, N.; Augendre, E.; Chao, R.; Li, J.; Zhang, J.; Muthinti, R.; Boureau, V.; Yamashita, T.; Faynot, O.
2019 IEEE International Electron Devices Meeting (IEDM) Electron Devices Meeting (IEDM), 2019 IEEE International. :11.5.1-11.5.4 Dec, 2019
Conference
Pons, N.; Triozon, F.; Jaud, M.-A.; Coquand, R.; Martinie, S.; Rozeau, O.; Niquet, Y.-M.; Nguyen, V.-H.; Oudrhiri, A. Idrissi-El; Barraud, S.
2013 International Conference on Simulation of Semiconductor Processes and Devices (SISPAD) Simulation of Semiconductor Processes and Devices (SISPAD), 2013 International Conference on. :184-187 Sep, 2013
Conference
Coquand, R.; Barraud, S.; Casse, M.; Koyama, M.; Maffini-Alvaro, V.; Samson, M.-P.; Tosti, L.; Mescot, X.; Ghibaudo, G.; Monfray, S.; Boeuf, F.; Faynot, O.; De Salvo, B.
2013 Proceedings of the European Solid-State Device Research Conference (ESSDERC) Solid-State Device Research Conference (ESSDERC), 2013 Proceedings of the European. :198-201 Sep, 2013
Influence of device scaling on low-frequency noise in SOI tri-gate N- and p-type Si nanowire MOSFETs
Conference
2013 Proceedings of the European Solid-State Device Research Conference (ESSDERC) Solid-State Device Research Conference (ESSDERC), 2013 Proceedings of the European. :300-303 Sep, 2013
Conference
2013 22nd International Conference on Noise and Fluctuations (ICNF) Noise and Fluctuations (ICNF), 2013 22nd International Conference on. :1-4 Jun, 2013
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[AR] Coquand, R.
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