학술논문
'학술논문'
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Academic Journal
Reed, B.D.; Meyer, M.J.; Abramzon, V.; Ad, O.; Adcock, P.; Ahmad, F.R.; Alppay, G.; Ball, J.A.; Beach, J.; Belhachemi, D.; Bellofiore, A.; Bellos, M.; Beltrán, J.F.; Betts, A.; Bhuiya, M.W.; Blacklock, K.; Boer, R.; Boisvert, D.; Brault, N.D.; Buxbaum, A.; Caprio, S.; Choi, C.; Christian, T.D.; Clancy, R.; Clark, J.; Connolly, T.; Croce, K.F.; Cullen, R.; Davey, M.; Davidson, J.; Elshenawy, M.M.; Ferrigno, M.; Frier, D.; Gudipati, S.; Hamill, S.; He, Z.; Hosali, S.; Huang, H.; Huang, L.; Kabiri, A.; Kriger, G.; Lathrop, B.; Li, A.; Lim, P.; Liu, S.; Luo, F.; Lv, C.; Ma, X.; McCormack, E.; Millham, M.; Nani, R.; Pandey, M.; Parillo, J.; Patel, G.; Pike, D.H.; Preston, K.; Rearick, K.; Rearick, T.; Schmid, G.; Schultz, J.; Shi, X.; Singh, B.; Srivastava, N.; Stewman, S.F.; Thurston, T.R.; Trioli, P.; Tullman, J.; Wang, X.; Wang, Y.-C.; Webster, E.A.G.; Zhang, Z.; Zuniga, J.; McKenna, M.; Dyer, M.D.; Rothberg, J.M.; Pichard-Kostuch, A.; Ribezzi-Crivellari, M.; Griffiths, A.D.; Patel, S.S.; van Oijen, A.M.
In: Science . (Science, 14 October 2022, 378(6616))
Conference
2010 IEEE International 3D Systems Integration Conference (3DIC) 3D Systems Integration Conference (3DIC), 2010 IEEE International. :1-6 Nov, 2010
Conference
Teh, W.H.; Deeb, C.; Burggraf, J.; Wimplinger, M.; Matthias, T.; Young, R.; Senowitz, C.; Buxbaum, A.
2010 IEEE International Interconnect Technology Conference Interconnect Technology Conference (IITC), 2010 International. :1-3 Jun, 2010
Conference
In: Conference Proceedings from the International Symposium for Testing and Failure Analysis , ISTFA 2023: Proceedings of the 49th International Symposium for Testing and Failure Analysis Conference. (Conference Proceedings from the International Symposium for Testing and Failure Analysis, 2023, 2023-November:300-304)
Academic Journal
Goldstein, A.; Norman, J.; Skovronsky, G.; Kopits, I; O'keefe, K.; O'keefe, C.; Buxbaum, A.; Vantha, T.; Sovannara, T.
Academic Journal
In: Global Health Science and Practice . (Global Health Science and Practice, February 2014, 2(1):23-34)
Academic Journal
Bell, R.E.; Golan, T.; Buxbaum, A.; Postolsky, B.; Levy, C.; Khaled, M.; Schubert, S.; Janas, M.M.; Goldberg, M.S.; Netanely, D.; Shamir, R.
In: Journal of Investigative Dermatology . (Journal of Investigative Dermatology, February 2014, 134(2):441-451)
Conference
Neumann, J.T.; Klochkov, D.; Korb, T.; Foca, E.; Gupta, S.; Avishai, A.; Pichumani, R.; Lee, K.; Buxbaum, A.
In: Proceedings of SPIE - The International Society for Optical Engineering , Metrology, Inspection, and Process Control for Microlithography XXXIV. (Proceedings of SPIE - The International Society for Optical Engineering, 2020, 11325)
Academic Journal
Kuchibhatla, S.V.N.T.; Shutthanandan, V.; Adusumilli, P.; Arey, B.; Wang, C.M.; Thevuthasan, S.; Prosa, T.J.; Ulfig, R.; Buxbaum, A.; Wang, Y.C.; Tessner, T.
In: Nanotechnology . (Nanotechnology, 1 June 2012, 23(21))
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[AR] Buxbaum, A.
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