학술논문
'학술논문'
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1~10
Academic Journal
IEEE Transactions on Microwave Theory and Techniques IEEE Trans. Microwave Theory Techn. Microwave Theory and Techniques, IEEE Transactions on. 72(10):5809-5817 Oct, 2024
Academic Journal
Neininger, P.; Mikulla, M.; Döring, P.; Dammann, M.; Thome, F.; Krause, S.; Schwantuschke, D.; Brückner, P.; Friesicke, C.; Quay, R.
In e-Prime - Advances in Electrical Engineering, Electronics and Energy June 2023 4
Conference
Schwantuschke, D.; Ture, E.; Bruckner, P.; Neininger, P.; Tessmann, A.; Zink, M.; Kuri, M.; Meder, D.; Wagner, S.; Lozar, R.
2023 18th European Microwave Integrated Circuits Conference (EuMIC) Microwave Integrated Circuits Conference (EuMIC), 2023 18th European. :129-132 Sep, 2023
Academic Journal
Doring, P.; Sinnwell, M.; Muller, S.; Czap, H.; Driad, R.; Bruckner, P.; Kohler, K.; Kirste, L.; Mikulla, M.; Quay, R.
IEEE Transactions on Electron Devices IEEE Trans. Electron Devices Electron Devices, IEEE Transactions on. 70(3):947-952 Mar, 2023
Academic Journal
Dammann, M.; Baeumler, M.; Brückner, P.; Kemmer, T.; Konstanzer, H.; Graff, A.; Simon-Najasek, M.; Quay, R.
In Microelectronics Reliability September 2018 88-90:385-388
Academic Journal
IEEE Electron Device Letters IEEE Electron Device Lett. Electron Device Letters, IEEE. 44(1):17-20 Jan, 2023
Academic Journal
Dammann, M.; Baeumler, M.; Polyakov, V.; Brückner, P.; Konstanzer, H.; Quay, R.; Mikulla, M.; Graff, A.; Simon-Najasek, M.
In Microelectronics Reliability September 2017 76-77:292-297
Academic Journal
IEEE Transactions on Microwave Theory and Techniques IEEE Trans. Microwave Theory Techn. Microwave Theory and Techniques, IEEE Transactions on. 70(2):1367-1376 Feb, 2022
Conference
Dammann, M.; Baeumler, M.; Kemmer, T.; Konstanzer, H.; Bruckner, P.; Krause, S.; Graff, A.; Simon-Najasek, M.
2021 IEEE International Reliability Physics Symposium (IRPS) Reliability Physics Symposium (IRPS), 2021 IEEE International. :1-7 Mar, 2021
Academic Journal
Dammann, M.; Baeumler, M.; Brückner, P.; Bronner, W.; Maroldt, S.; Konstanzer, H.; Wespel, M.; Quay, R.; Mikulla, M.; Graff, A.; Lorenzini, M.; Fagerlind, M.; van der Wel, P.J.; Roedle, T.
In Microelectronics Reliability August-September 2015 55(9-10):1667-1671
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[AR] Bruckner, P.
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